Metrology and standardization for nanotechnology : protocols and industrial innovations

• Material Type: 図書
• ISBN: 3527340394 (hbk); 9783527340392 (hbk)
• Title: Metrology and standardization for nanotechnology : protocols and industrial innovations
• Author/Editor: edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
• Series Title: Nanotechnology innovation & applications
• Title Heading: Nanotechnology innovation & applications.
• Author Heading: Mansfield, Elisabeth.
• Publication, Distribution, etc.: Weinheim, Germany : Wiley-Vch Verlag GmbH & Co. KGaA (出版)
• Publication Date: [2017]; 著作権日付 : ©2017
• Publication Date (W3CDTF): 2017
• Extent: xxxii, 594 pages
• Other physical details: illustrations, charts (some color)
• Size: 25 cm.
• Place of Publication (Country Code): DE
• Text Language Code: eng
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Nanotechnology--Research.; Nanostructured materials--Research.
• LCC: T174.7
• NDLC: M21
• Target Audience: 一般
• Note (Bibliography): Includes bibliographical references and index.
• Collection (particular): 日本関係外国語図書
• Holding library: 国立国会図書館
• Call No.: M21-B99
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028025078; http://id.ndl.go.jp/bib/028025078
• OCLC No.: 956395716; https://www.worldcat.org/oclc/956395716
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 211

• Contents: Nanotechnology basics: definitions, synthesis, and propertiesMetrology for engineered nanomaterialsNanotechnology standards...
• Summary, etc.: This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, inter...