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2016 32nd thermal measurement, modeling & management symposium : (SEMI-THERM 2016) : San Jose, California, USA : 14-17 March 2016 : SEMI-THERM short courses : SEMI-THERM 32 : 32nd annual conference on thermal design, management, measurement and characterization of semiconductor components and systems : Mar 2016, San Jose, CA.

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2016 32nd thermal measurement, modeling & management symposium : (SEMI-THERM 2016) : San Jose, California, USA : 14-17 March 2016 : SEMI-THERM short courses : SEMI-THERM 32 : 32nd annual conference on thermal design, management, measurement and characterization of semiconductor components and systems : Mar 2016, San Jose, CA.

Call No. (NDL)
M17-17-2413
Bibliographic ID of National Diet Library
028048763
Material type
図書
Author
IEEE Semiconductor Thermal Measurement and Management Symposium (32nd : 2016 : San Jose, Calif.)
Publisher
IEEE
Publication date
[2016]
Material Format
Paper
Capacity, size, etc.
iv, 223 pages ; 28 cm
NDC
-
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Abstracts and papers."SEMI-THERM 32 has a rich program comprised of: 6 pre-conference short courses ... 4 how to courses ... 12 vendor workshops, 2day...

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Paper

Material Type
図書
ISBN
9781509023370 (print)
ISSN
1065-2221
Publication, Distribution, etc.
Publication Date
[2016]
著作権日付 : ©2016
Publication Date (W3CDTF)
2016
Extent
iv, 223 pages
Other physical details
illustrations