2016 IEEE 34th VLSI test symposium (VTS 2016) : Las Vegas, Nevada, USA : 25-27 April 2016 : intl. IEEE VLSI test symposium 2016 : Apr 2016, Las Vegas, NV.

Call No. (NDL): M17-17-2424
Bibliographic ID of National Diet Library: 028049329

Material type: 図書

Author: IEEE VLSI Test Symposium (34th : 2016 : Las Vegas, Nev.)

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: 273 pages ; 28 cm

NDC: -

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Note (General)：: Abstracts and papers."Welcome to VTS 2016, the thirty-fourth in a series of annual symposia ..."--Foreword."... VTS 2016 features several special sess...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781467384551 (Print-On-Demand)
ISSN: 1093-0167
Title: 2016 IEEE 34th VLSI test symposium (VTS 2016) : Las Vegas, Nevada, USA : 25-27 April 2016 : intl. IEEE VLSI test symposium 2016 : Apr 2016, Las Vegas, NV.
Author Heading: IEEE VLSI Test Symposium (34th : 2016 : Las Vegas, Nev.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: 273 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.
Integrated Circuits--Very Large Scale Integration.
Integrated circuits--Very large scale integration--Testing.
LCC: TK7874.75
NDLC: M17
Target Audience: 一般
Note (Target Audience): Scholarly & Professional
Note (General): Abstracts and papers.
"Welcome to VTS 2016, the thirty-fourth in a series of annual symposia ..."--Foreword.
"... VTS 2016 features several special sessions including ... and one embedded tutorial."--Foreword.
"Prior to the core of VTS 2016, four half-day tutorials will also be offered ..."--Foreword.
IEEE catalog number CFP16029-POD.
Note (Content): The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug, and repair of microelectronic circuits and systems.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-17-2424
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028049329
http://id.ndl.go.jp/bib/028049329
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215