2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016.

Call No. (NDL): M17-18-1579
Bibliographic ID of National Diet Library: 028452672

Material type: 図書

Author: International Test Conference (47th : 2016 : Fort Worth, Tex.)

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: 490 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Abstracts and selected papers.IEEE catalog number CFP16ITC-POD.

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781467387743 (Print-On-Demand)
ISSN: 1089-3539
Title: 2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016.
Author Heading: International Test Conference (47th : 2016 : Fort Worth, Tex.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: 490 pages
Other physical details: illustrations
Size: 28 cm
Additional Title: 47th international test conference : Nov 2016, Fort Worth, TX.
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Testing--Congresses.
Electronic digital computers--Circuits--Testing--Congresses.
Computer software--Testing--Congresses.
Semiconductors--Testing--Congresses.
Radio frequency--Congresses.
Telecommunication--Congresses.
Computer software--Testing.
Electronic digital computers--Circuits--Testing.
Integrated circuits--Testing.
Radio frequency.
Semiconductors--Testing.
Telecommunication.
LCC: TK7874
NDLC: M17
Target Audience: 一般
Note (General): Abstracts and selected papers.
IEEE catalog number CFP16ITC-POD.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-18-1579
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028452672
http://id.ndl.go.jp/bib/028452672
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215