2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.

• Material Type: 図書
• ISBN: 9781467387743 (Print-On-Demand)
• ISSN: 1089-3539
• Title: 2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.
• Author Heading: International Test Conference (47th : 2016 : Fort Worth, Tex.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2016]; 著作権日付 : ©2016
• Publication Date (W3CDTF): 2016
• Extent: 490 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Testing--Congresses.; Electronic digital computers--Circuits--Testing--Congresses.; Computer software--Testing--Congresses.; Semiconductors--Testing--Congresses.; Radio frequency--Congresses.; Telecommunication--Congresses.; Computer software--Testing.; Electronic digital computers--Circuits--Testing.; Integrated circuits--Testing.; Radio frequency.; Semiconductors--Testing.; Telecommunication.
• LCC: TK7874
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts and selected papers.; IEEE catalog number CFP16ITC-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-18-1579
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028452672; http://id.ndl.go.jp/bib/028452672
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215