2016 IEEE 25th Asian test symposium (ATS 2016) : Hiroshima, Japan : 21-24 November 2016 : IEEE annual event : Nov 2016, Hiroshima, Japan.

Call No. (NDL): M17-18-1580
Bibliographic ID of National Diet Library: 028452699

Material type: 図書

Author: Asian Test Symposium (25th : 2016 : Hiroshima-shi, Japan)

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: xxxii, 318 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Abstracts and papers."In addition to the technical and industry sessions, the ATS program includes two plenary sessions, ... and two half-day tutorial...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781509038107 (print)
ISSN: 1081-7735
Title: 2016 IEEE 25th Asian test symposium (ATS 2016) : Hiroshima, Japan : 21-24 November 2016 : IEEE annual event : Nov 2016, Hiroshima, Japan.
Author Heading: Asian Test Symposium (25th : 2016 : Hiroshima-shi, Japan)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: xxxii, 318 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Electronic digital computers--Circuits--Testing--Congresses.
Electronic circuits--Testing--Congresses.
Fault-tolerant computing--Congresses.
Electronic circuits--Testing.
Electronic digital computers--Circuits--Testing.
Fault-tolerant computing.
LCC: TK7888.4
NDLC: M17
Target Audience: 一般
Note (General): Abstracts and papers.
"In addition to the technical and industry sessions, the ATS program includes two plenary sessions, ... and two half-day tutorials."--Foreword.
IEEE catalog number CFP16067-POD.
Note (Content): Annotation
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-18-1580
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028452699
http://id.ndl.go.jp/bib/028452699
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215