Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 : SIMS-4 : Nov 1983, Osaka, Japan.

• Material Type: 図書
• ISBN: 9783642822582 (Softcover)
• Title: Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 : SIMS-4 : Nov 1983, Osaka, Japan.
• Series Title: Springer Series in Chemical Physics ; 36
• Title Heading: Springer series in chemical physics ; 36.
• Author Heading: Benninghoven, A.; Okano, J.; Shimizu, R.; Werner, H. W.
• Publication, Distribution, etc.: Berlin : Springer; Heidelberg : Springer
• Publication Date: [1984]
• Publication Date (W3CDTF): 1984
• Extent: xv, 503 pages
• Size: 24 cm.
• Alternative Title: Secondary ion mass spectrometry : SIMS 4 : proceedings of the 4th international conference, Osaka, Japan, November 13-19, 1983
• Place of Publication (Country Code): DE
• Text Language Code: eng
• Note (Text Language): English.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Chemistry.; Physical organic chemistry.
• LCC: QD450-882
• DDC: 541
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers and an abstract.; "Softcover reprint of the hardcover 1st edition 1984"--Title page verso.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-19-381
• Related Material (DOI): 10.1007/978-3-642-82256-8
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028545383; http://id.ndl.go.jp/bib/028545383
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215

• Summary, etc.: This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hot...