図書

Optical measurement systems for industrial inspection XI : 24-27 June 2019 : Munich, Germany : biannual Munich SPIE symposium "optical metrology" : laser world of photonics congress : Munich conference : Jun 2019, Munich, Germany. (SPIE Proceedings ; 11056)

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Optical measurement systems for industrial inspection XI : 24-27 June 2019 : Munich, Germany : biannual Munich SPIE symposium "optical metrology" : laser world of photonics congress : Munich conference : Jun 2019, Munich, Germany.

(SPIE Proceedings ; 11056)

Call No. (NDL)
M17-20-1083
Bibliographic ID of National Diet Library
030095632
Material type
図書
Author
European Optical Society (EOS)ほか
Publisher
SPIE
Publication date
[2019]
Material Format
Paper
Capacity, size, etc.
2 volumes ; 28 cm.
NDC
-
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Papers."This year the conference takes place for the eleventh time, ..."--Part 1, introduction.

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Paper

Material Type
図書
ISBN (set)
9781510627918 (set)
ISSN (series)
0277-786X
Publication, Distribution, etc.
Publication Date
[2019]
Publication Date (W3CDTF)
2019
Extent
2 volumes