世界半導体製造装置・試験/検査装置市場年鑑 2017 (LSI database)

世界半導体製造装置・試験/検査装置市場年鑑 = Semiconductor equipment test/inspection worldwide annual. 2017

(LSI database)

Call No. (NDL): YU9-M379
Bibliographic ID of National Diet Library: 030464474

Material type: 図書

Author: -

Publisher: グローバルネット

Publication date: 2017.3

Material Format: Paper

Capacity, size, etc.: 985 p ; 28 cm

NDC: 549.8093

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Notes on use

Accompanying material：: DVD-ROM 1枚 (12 cm)

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Bibliographic Record

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Paper

Material Type: 図書
ISBN: 978-4-907847-67-8
Title: 世界半導体製造装置・試験/検査装置市場年鑑
Title Transcription: セカイハンドウタイセイゾウソウチ・シケン / ケンサソウチシジョウネンカン
Volume: 2017
Series Title: LSI database
Publication, Distribution, etc.: 東京 : グローバルネット (出版)
Publication Date: 2017.3
Publication Date (W3CDTF): 2017
Extent: 985 p
Size: 28 cm
Accompanying material: DVD-ROM 1枚 (12 cm)
Alternative Title: Semiconductor equipment test/inspection worldwide annual Semiconductor equipment test / inspection worldwide annual
Semiconductor equipment test/inspection worldwide annual
Place of Publication (Country Code): JP
Text Language Code: jpn
Content Type: テキスト
不明
Media Type: 機器不用
コンピュータ
Carrier Type: 冊子
コンピュータ・ディスク
Subject Heading: 半導体製造装置製造業ハンドウタイセイゾウソウチセイゾウギョウ ( 001237270 )Authorities
NDC 10th ed.: 549.8093 : Electronic engineering
NDLC: YU9
DL475
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: YU9-M379
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 030464474
http://id.ndl.go.jp/bib/030464474
National Bibliography No. (JPNO): 23835648
Cataloging Rule: Nippon Cataloging Rules 2018 Edition
Bibliographic Record Category (NDL): 111

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