Means and methods for measurement and monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed papers from the 8th international conference on advanced micro device engineering (AMDE 2016), December 9, 2016, Kiryu, Japan : Dec 2016, Kiryu, Japan.

• Material Type: 図書
• ISBN: 9783035715538; 303571553X; 9783035735536 (electronic book); 3035735530 (electronic book)
• ISSN (series): 1660-9336
• Title: Means and methods for measurement and monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed papers from the 8th international conference on advanced micro device engineering (AMDE 2016), December 9, 2016, Kiryu, Japan : Dec 2016, Kiryu, Japan.
• Series Title: Applied Mechanics and Materials ; 888
• Title Heading: Applied mechanics and materials ; v. 888.
• Author Heading: Hanaizumi, Osamu.; Gunma University. Human Resource Cultivation Center.; International Conference on Advanced Micro-Device Engineering (8th : 2016 : Kiryū-shi, Japan)
• Publication, Distribution, etc.: Zurich, Switzerland : Trans Tech Publications Ltd (出版)
• Publication Date: [2019]
• Publication Date (W3CDTF): 2019
• Extent: viii, 95 pages
• Size: 24 cm.
• Alternative Title: Means and methods for measurement and monitoring : supplement book to advanced micro-device engineering 8 : selected, peer reviewed papers from the 8th international conference on advanced micro device engineering (AMDE 2016), December 9, 2016, Kiryu, Japan
• Place of Publication (Country Code): CH
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Nanotechnology--Research--Congresses.; Microelectromechanical systems--Research--Congresses.; Miniature electronic equipment--Technological innovations--Congresses.; Microelectronics--Technological innovations--Congresses.; Mechatronics--Technological innovations--Congresses.; TECHNOLOGY & ENGINEERING--Engineering (General); TECHNOLOGY & ENGINEERING--Reference.; Microelectronics--Technological innovations.; Nanotechnology--Research.
• LCC: T174.7
• DDC: 620/.5
• NDLC: M17
• Target Audience: 一般
• Note (General): Selected papers.
• Note (Bibliography): Includes bibliographical references and indexes.
• Holding library: 国立国会図書館
• Call No.: M17-21-789
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 031302270; http://id.ndl.go.jp/bib/031302270
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215