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Variability in BTI-Induced Device Degradation: from Silicon Measurement to SRAM Yield Prediction
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国立国会図書館デジタルコレクション
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DOI[10.14989/doctor.k19862]to the data of the same series
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- Material Type
- 博士論文
- Title
- Author/Editor
- Awano, Hiromitsu
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- 2016-03-23
- Publication Date (W3CDTF)
- 2016-03-23
- Alternative Title
- トランジスタのBTI劣化ばらつきに関する研究：特性評価からSRAM 回路歩留り予測へ
- Contributor
- 佐藤, 高史小野寺, 秀俊髙木, 直史
- Degree grantor/type
- 京都大学