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第 1 部 (1) 半導体材料の界面応力/弾性定数の原子レベル評価

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第 1 部 (1) 半導体材料の界面応力/弾性定数の原子レベル評価

Persistent ID (NDL)
info:ndljp/pid/10351206
Material type
記事
Author
泉,聡志ほか
Publisher
日本機械学会
Publication date
2003-03-27
Material Format
Digital
Journal name
材料力学部門春のシンポジウム講演論文集 2003
Publication Page
p.1-6
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Notes on use

Note (General):

著者所属: 東大工Affiliation: Department of Mechanical Engineering, School of Engineering, The University of Tokyo

Detailed bibliographic record

Summary, etc.:

For nano-scale thin film, effects of surface and interface, which can be ignored on a macro scale, become important. For example, surface (interface) ...

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Digital

Material Type
記事
Author/Editor
泉,聡志
原,祥太郎
熊谷,知久
酒井,信介
Publication, Distribution, etc.
Publication Date
2003-03-27
Publication Date (W3CDTF)
2003-03-27
Alternative Title
The atomic level evaluation of the interface stress and interface elastic constants for semiconductor materials
Periodical title
材料力学部門春のシンポジウム講演論文集
No. or year of volume/issue
2003
Volume
2003