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博士論文

Highly Reliable Memory Architectures Using Combination of In-Field Self-Repair, ECC and Aging Test

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国立国会図書館デジタルコレクション

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DOI[10.34413/dr.01372]to the data of the same series

Highly Reliable Memory Architectures Using Combination of In-Field Self-Repair, ECC and Aging Test

Persistent ID (NDL)
info:ndljp/pid/10958598
Material type
博士論文
Author
Mayuga, Gian Paolo Topico
Publisher
Nara Institute of Science and Technology
Publication date
2016-09-26
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
奈良先端科学技術大学院大学,博士(工学)
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Provided by：国立国会図書館デジタルコレクションLink to Help Page

  • 2023-09-08 再収集

  • 2023-09-08 再収集

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Digital

Material Type
博士論文
Title
Highly Reliable Memory Architectures Using Combination of In-Field Self-Repair, ECC and Aging Test
Author/Editor
Mayuga, Gian Paolo Topico
Author Heading
Mayuga, Gian Paolo Topico
Publication, Distribution, etc.
Nara Institute of Science and Technology
Publication Date
2016-09-26
Publication Date (W3CDTF)
2016-09-26
Alternative Title
フィールドでの自己修復、誤り訂正、劣化検知を組み合わせた高信頼メモリアーキテクチャ
フィールド デノ ジコ シュウフク アヤマリ テイセイ レッカ ケンチ オ クミアワセタ コウシンライ メモリ アーキテクチャ
Degree grantor/type
奈良先端科学技術大学院大学
Date Granted
2016-09-26