Built-in Quiescent Supply Current Test Circuits for Electrical Interconnect Tests in 3D Stacked ICs

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Built-in Quiescent Supply Current Test Circuits for Electrical Interconnect Tests in 3D Stacked ICs

Persistent ID (NDL): info:ndljp/pid/11458086

Material type: 博士論文

Author: Binti Ali, Fara Ashikin

Publisher: -

Publication date: 2018-09-27

Material Format: Digital

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Name of awarding university/degree: 徳島大学,博士（工学）

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Material Type: 博士論文
Title: Built-in Quiescent Supply Current Test Circuits for Electrical Interconnect Tests in 3D Stacked ICs
Author/Editor: Binti Ali, Fara Ashikin
Author Heading: Binti Ali, Fara Ashikin
Publication Date: 2018-09-27
Publication Date (W3CDTF): 2018-09-27
Alternative Title: 3D積層ICの静的電源電流による電気的配線テストのための組み込み型検査回路に関する研究
Degree grantor/type: 徳島大学
Date Granted: 2018-09-27
Date Granted (W3CDTF): 2018-09-27
Dissertation Number: 甲第3236号
Degree Type: 博士（工学）
Conferring No. (Dissertation): 甲第3236号
Text Language Code: eng
Subject Heading: 3D Stacked IC
Open defects
Design-for-Testability
Through-Silicon Via
Electrical Interconnect Tests
Target Audience: 一般
Persistent ID (NDL): info:ndljp/pid/11458086
https://dl.ndl.go.jp/pid/11458086
Collection: 障害者向け資料
Collection (Materials For Handicapped People:1): テキストデータ
Collection (particular): 国立国会図書館デジタルコレクション > デジタル化資料 > 博士論文
https://dl.ndl.go.jp/collections/A00014
Acquisition Basis: 博士論文（自動収集）
Date Accepted (W3CDTF): 2020-03-11T23:38:06+09:00
Format (IMT): application/pdf
Access Restrictions: 国立国会図書館内限定公開
Service for the Digitized Contents Transmission Service: 図書館・個人送信対象外
Availability of remote photoduplication service: 可
Periodical Title (URI): https://repo.lib.tokushima-u.ac.jp/112884
Data Provider (Database): 国立国会図書館 : 国立国会図書館デジタルコレクション
https://dl.ndl.go.jp