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電子書籍・電子雑誌EPS : Earth, Planets and Space
Volume number72
ArticleThe univer...

The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

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DOI[10.1186/s40623-020-01267-2]to the data of the same series

The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

Persistent ID (NDL)
info:ndljp/pid/11616218
Material type
記事
Author
Motoo Itoほか
Publisher
Springer Nature
Publication date
2020-09-14
Material Format
Digital
Journal name
EPS : Earth, Planets and Space 72(133)
Publication Page
-
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Digital

Material Type
記事
Title
The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials
Author/Editor
Motoo Ito
Naotaka Tomioka
Kentaro Uesugi
Publication, Distribution, etc.
日本 : Springer Nature
Publication Date
2020-09-14
Publication Date (W3CDTF)
2020-09-14
Periodical title
EPS : Earth, Planets and Space
No. or year of volume/issue
72(133)
Volume
72(133)
ISSN (Periodical Title)
1880-5981