博士論文
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SAW Deviceを応用した電子材料特性の非接触計測技術 ―Graphene/SiO2/Si積層体の外部電界による結合特性計測―

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SAW Deviceを応用した電子材料特性の非接触計測技術 ―Graphene/SiO2/Si積層体の外部電界による結合特性計測―

Persistent ID (NDL)
info:ndljp/pid/11673985
Material type
博士論文
Author
大西, 孝一
Publisher
-
Publication date
2020-03-25
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
九州工業大学,博士(工学)
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Notes on use at the National Diet Library

Notes on use

Note (General):

九州工業大学博士学位論文 学位記番号:工博甲第496号 学位授与年月日:令和2年3月25日令和元年度

Table of Contents

  • 2023-08-05 再収集

  • 2023-10-11 再収集

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Digital

Material Type
博士論文
Author/Editor
大西, 孝一
Author Heading
Publication Date
2020-03-25
Publication Date (W3CDTF)
2020-03-25
Contributor
孫, 勇
Degree grantor/type
九州工業大学
Date Granted
2020-03-25
Date Granted (W3CDTF)
2020-03-25