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Analysis of Scars and Keloids by Focused Ion Beam/Scanning Electron Microscopy: Distinguishing Between Hypertrophic Scars and Keloids
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国立国会図書館デジタルコレクション
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DOI[info:doi/10.1097/SAP.0000000000002231]to the data of the same series
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- Material Type
- 博士論文
- Author/Editor
- 右田, 尚
- Author Heading
- Publication Date
- 2020-04-01
- Publication Date (W3CDTF)
- 2020-04-01
- Alternative Title
- 集束イオンビーム観察装置付走査型電子顕微鏡を用いた瘢痕およびケロイドの解析―肥厚性瘢痕とケロイドの鑑別―
- Degree grantor/type
- 久留米大学
- Date Granted
- 2020-04-01
- Date Granted (W3CDTF)
- 2020-04-01