博士論文

In-process Measurement in Micro/nano-Stereolithography Using Optical Response from Near-Substrate Resin with Refractive Index Variation

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DOI[10.15083/0002002035]to the data of the same series

In-process Measurement in Micro/nano-Stereolithography Using Optical Response from Near-Substrate Resin with Refractive Index Variation

Persistent ID (NDL)
info:ndljp/pid/11864335
Material type
博士論文
Author
孔, 徳卿
Publisher
-
Publication date
2019-03-25
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
東京大学,博士(工学)
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学位の種別: 課程博士審査委員会委員 : （主査）東京大学教授 高橋 哲, 東京大学教授 高増 潔, 東京大学教授 志村 努, 東京大学教授 近藤 高志, 東京大学准教授 梶原 優介

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Digital

Material Type
博士論文
Title
In-process Measurement in Micro/nano-Stereolithography Using Optical Response from Near-Substrate Resin with Refractive Index Variation
Author/Editor
孔, 徳卿
Author Heading
孔, 徳卿
Publication Date
2019-03-25
Publication Date (W3CDTF)
2019-03-25
Alternative Title
光近接場領域における樹脂屈折率変化応答に基づくナノ光造形のインプロセス計測
Degree grantor/type
東京大学
Date Granted
2019-03-25
Date Granted (W3CDTF)
2019-03-25