博士論文

Planar型およびFinFET型SRAMにおける地上放射線起因シングルイベントアップセットに関する実験的研究

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DOI[10.18910/82290]to the data of the same series

Planar型およびFinFET型SRAMにおける地上放射線起因シングルイベントアップセットに関する実験的研究

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info:ndljp/pid/12219426
Material type
博士論文
Author
黒木, 貴志
Publisher
-
Publication date
2021-03-24
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
OU,博士（情報科学）
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T. Kato et al., "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles," in IEEE Transaction...

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Digital

Material Type
博士論文
Title
Planar型およびFinFET型SRAMにおける地上放射線起因シングルイベントアップセットに関する実験的研究
Title Transcription
プレーナーガタオヨビフィンフェットガタエスラムニオケルチジョウホウシャセンキインシングルイベントアップセットニカンスルジッケンテキケンキュウ
Author/Editor
黒木, 貴志
Author Heading
黒木, 貴志
Publication Date
2021-03-24
Publication Date (W3CDTF)
2021-03-24
Alternative Title
An Experimental Study on Terrestrial Radiation-Induced Single Event Upsets in Planar and FinFET SRAMs
Degree grantor/type
OU
Date Granted
2021-03-24