Jump to main content

博士論文

大電力用半導体デバイスの宇宙線故障率計算手法

Icons representing 博士論文
The cover of this title could differ from library to library. Link to Help Page

Available in National Diet Library

Find on the publisher's website

国立国会図書館デジタルコレクション

Digital data available

Check on the publisher's website

DOI[10.18997/00008911]to the data of the same series

大電力用半導体デバイスの宇宙線故障率計算手法

Persistent ID (NDL)
info:ndljp/pid/12303865
Material type
博士論文
Author
Gollapudi, Srikanth
Publisher
-
Publication date
2022-03-25
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
九州工業大学,博士（工学）
View All

Notes on use at the National Diet Library

本資料は、掲載誌(URI)等のリンク先にある学位授与機関のWebサイトやCiNii DissertationsLeave the NDL website. から、本文を自由に閲覧できる場合があります。

Notes on use

Note (General)：

九州工業大学博士学位論文 学位記番号: 生工博甲第428号 学位授与年月日: 令和4年3月25日令和3年度

Detailed bibliographic record

Summary, etc.：

Power semiconductor devices are susceptible to catastrophic failures when exposed to energetic particles present in cosmic radiation. The most serious...

Search by Bookstore

Search by Bookstore

Read this material in an accessible format.

View materials in accessible formats for people with print disabilities (1Type)

Table of Contents

Provided by：国立国会図書館デジタルコレクションLink to Help Page

  • 2023-08-05 再収集

  • 2023-10-11 再収集

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • Kyutacar

    Digital
    You can check the holdings of institutions and databases with which Institutional Repositories DataBase(IRDB)(Institutional Repository) is linked at the site of Institutional Repositories DataBase(IRDB)(Institutional Repository).
    Kyutacar

Search by Bookstore

Read in Disability Resources

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Digital

Material Type
博士論文
Title
大電力用半導体デバイスの宇宙線故障率計算手法
Author/Editor
Gollapudi, Srikanth
Author Heading
Gollapudi, Srikanth
Publication Date
2022-03-25
Publication Date (W3CDTF)
2022-03-25
Alternative Title
A universal failure rate calculation method for single event burnout in high power semiconductor devices
Contributor
大村, 一郎
Degree grantor/type
九州工業大学
Date Granted
2022-03-25