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電子書籍・電子雑誌Journal of laser micro/nanoengineering
Volume number20 (1)
Probe-beam...

Probe-beam deflection diagnostic of shock waves generated during direct laser interference patterning

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Probe-beam deflection diagnostic of shock waves generated during direct laser interference patterning

Persistent ID (NDL)
info:ndljp/pid/14634172
Material type
記事
Author
Tobias Steegeほか
Publisher
Japan Laser Processing Society
Publication date
2025-04
Material Format
Digital
Journal name
Journal of laser micro/nanoengineering 20(1)
Publication Page
-
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コレクション : 国立国会図書館デジタルコレクション > 電子書籍・電子雑誌 > 学術機関 > 学協会(Provided by: CiNii Research)

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Digital

Material Type
記事
Author/Editor
Tobias Steege
Clarita Muntschick
Christoph Zwahr
Andrés F. Lasagni
Publication, Distribution, etc.
Publication Date
2025-04
Publication Date (W3CDTF)
2025-04
Periodical title
Journal of laser micro/nanoengineering
No. or year of volume/issue
20(1)
Volume
20(1)
ISSN (Periodical Title)
1880-0688