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電子書籍・電子雑誌粉砕
Volume number(68)
最新の粉体物性測定技...

最新の粉体物性測定技術

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最新の粉体物性測定技術

Persistent ID (NDL)
info:ndljp/pid/14674726
Material type
記事
Author
清水健司
Publisher
ホソカワミクロン
Publication date
2024-12-15
Material Format
Digital
Journal name
粉砕 (68)
Publication Page
-
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Summary, etc.:

<p><b>Background and Aims:</b> Powder technology plays a significant role in various industrial products, with increasing demands for higher functiona...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
清水健司
Publication, Distribution, etc.
Publication Date
2024-12-15
Publication Date (W3CDTF)
2024-12-15
Alternative Title
The latest powder property measurement technology
Periodical title
粉砕
No. or year of volume/issue
(68)
Volume
(68)
ISSN (Periodical Title)
2432-2075
ISSN-L (Periodical Title)
0429-9051
Text Language Code
jpn
Persistent ID (NDL)
info:ndljp/pid/14674726
Collection (Materials For Handicapped People:1)
Collection (particular)
国立国会図書館デジタルコレクション > 電子書籍・電子雑誌 > その他
Acquisition Basis
オンライン資料収集制度
Date Accepted (W3CDTF)
2026-03-26T17:23:56+09:00
Date Captured (W3CDTF)
2025-04-20
Format (IMT)
application/pdf
Access Restrictions
国立国会図書館内限定公開
Service for the Digitized Contents Transmission Service
図書館・個人送信対象外
Availability of remote photoduplication service
Periodical Title (Persistent ID (NDL))
info:ndljp/pid/14674723
Data Provider (Database)
国立国会図書館 : 国立国会図書館デジタルコレクション

Digital

Summary, etc.
<p><b>Background and Aims:</b> Powder technology plays a significant role in various industrial products, with increasing demands for higher functionality driving the need for more advanced manufacturing processes. As these processes evolve, there is a growing need for enhanced techniques to evaluate powder properties. This report introduces two key devices developed by our company: the Parshe Analyzer<sup>®</sup> (PAS) for particle shape and size analysis, and the E-SPART Analyzer<sup>®</sup> (EST) for measuring particle charge distribution. These devices offer unique capabilities for precise particle characterization, meeting the sophisticated requirements of modern industrial applications.</p><p><b>Methods and Results:</b> The PAS is a dynamic image analysis system used to measure particle size and shape. While laser diffraction and scattering methods are common for particle size distribution measurement, they lack the capability to evaluate particle shape and detect coarse particles within a sample. The PAS addresses these limitations by utilizing dynamic image analysis, allowing high-throughput measurement of a large number of particles suspended in liquid. With its flat sheath flow system, the PAS maintains precise focus, ensuring accurate measurements for particles ranging from sub-micron to over 100 μm. It also features automated lens switching and an optional auto-sampler for efficient sample dispersion.</p><p>A measurement example of silicon carbide (<i>d</i><sub>50</sub>=5.6 μm) using the PAS is provided. After ultrasonic dispersion, the particles were analyzed, revealing variations in particle detection depending on the proximity of adjacent particles. This demonstrates the PAS’s capability to deliver both quantitative and qualitative data on particle size and morphology.</p><p>The EST is a device that measures particle size and charge using laser Doppler technology. It evaluates phase delay caused by particle inertia in an acoustic field to determine size and calculates charge based on drift velocity in an electric field. Unlike bulk methods like the Faraday cage, the EST provides detailed charge distribution data for individual particles. To address issues with discontinued parts, a new version of the EST is under development, featuring digital signal processing, miniaturization, and improved mobility.</p><p><b>Conclusions (Outlook):</b> The PAS and EST offer unique and precise insights into particle properties, providing advanced solutions for research and quality control applications. The ongoing development of these devices is expected to further support innovations in industries that require accurate particle characterization.</p>
<p>様々な工業製品には粉体技術が大きくかかわっている。製品の高機能化が進む中,製造プロセスにおいてより高度な粉体技術が用いられるようになり,それに伴い粉体の評価技術にも進化が求められている。粒子の形状評価や,ごく少量含まれる粗大粒子の評価には,画像解析法による粒子径測定が有効である。本稿では,動的画像解析装置「パーシェアナライザ<sup>®</sup>」の特徴を,実際の粉体測定例と共に紹介する。また粒子径分布と帯電量分布を測定する「イースパート アナライザ<sup>®</sup>」の原理と測定例についても説明する。</p>
DOI
10.24611/micromeritics.2025005
Access Restrictions
インターネット公開
Data Provider (Database)
科学技術振興機構 : J-STAGE

Digital

Summary, etc.
<p>様々な工業製品には粉体技術が大きくかかわっている。製品の高機能化が進む中,製造プロセスにおいてより高度な粉体技術が用いられるようになり,それに伴い粉体の評価技術にも進化が求められている。粒子の形状評価や,ごく少量含まれる粗大粒子の評価には,画像解析法による粒子径測定が有効である。本稿では,動的画像解析装置「パーシェアナライザ<sup>®</sup>」の特徴を,実際の粉体測定例と共に紹介する。また粒子径分布と帯電量分布を測定する「イースパート アナライザ<sup>®</sup>」の原理と測定例についても説明する。</p>
Data Provider (Database)
国立情報学研究所 : CiNii Research
Original Data Provider (Database)
Japan Link Center
雑誌記事索引データベース
Bibliographic ID (NDL)
14674726