半導体表面・界面の局在準位の評価技術
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- Material Type
- 記事
- Title
- Author/Editor
- 奥村次徳
- Publication, Distribution, etc.
- Publication Date
- 1988
- Publication Date (W3CDTF)
- 1988
- Alternative Title
- Characterization techniques for localized electronic states at semiconductor surfaces and interfaces
- Periodical title
- 表面科学 : 日本表面科学会誌
- No. or year of volume/issue
- 9(3)
- Volume
- 9(3)