APPLICATION OF SECONDARY-ION MASS SPECTROMETRY TO EXAMINATION OF OXIDES ON LWR SPECIMENS. (CEGB ; CEGB-TPRD-B-0856-R86; PWR-CWG-P-86-378)

APPLICATION OF SECONDARY-ION MASS SPECTROMETRY TO EXAMINATION OF OXIDES ON LWR SPECIMENS.

(CEGB ; CEGB-TPRD-B-0856-R86; PWR-CWG-P-86-378)

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Material Type: 図書
Title: APPLICATION OF SECONDARY-ION MASS SPECTROMETRY TO EXAMINATION OF OXIDES ON LWR SPECIMENS.
Author/Editor: PICK, M.E.(et al.)
Series Title: CEGB ; CEGB-TPRD-B-0856-R86; PWR-CWG-P-86-378
Author Heading: PICK, M.E.
Publication Date: 1986.
Publication Date (W3CDTF): 1986
Extent: 52
Target Audience: 一般
Data Provider (Database): 日本原子力研究開発機構 : 日本原子力研究開発機構所蔵目録データベース
https://library-documents.jaea.go.jp/opac/opac_search/