図書

Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

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Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

Material type
図書
Author
edited by T. Ogawa, M. Tajima
Publisher
North-Holland : Elsevier
Publication date
c2000
Material Format
Paper
Capacity, size, etc.
27 cm
NDC
-
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Paper

Material Type
図書
Author/Editor
edited by T. Ogawa, M. Tajima
Publication, Distribution, etc.
Publication Date
c2000
Publication Date (W3CDTF)
2000
Size
27 cm
Place of Publication (Country Code)
ne
Text Language Code
en