ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

Author: Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

Notes on use

Note (General)：: "IEEE Computer Society Order Number 1962""IEEE Catalog Number 89CH2742-5""SAN 264-620X"...

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Material Type: 図書
ISBN: 0818689625
Title: ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC
Author/Editor: Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
Author Heading: International Test Conference
https://ci.nii.ac.jp/author/DA0261156X
IEEE Computer Society. Test Technology Technical Committee
https://ci.nii.ac.jp/author/DA03323957
Institute of Electrical and Electronics Engineers. Philadelphia Section
https://ci.nii.ac.jp/author/DA02648490
Oberly, Raymon
Publication, Distribution, etc.: IEEE Computer Society Press
Institute of Electrical and Electronics Engineers, c1989
Publication Date (W3CDTF): 1989
Size: 28 cm
Alternative Title: 1989 IEEE International Test Conference
1962 89CH27425 264620X
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE Computer Society Order Number 1962"
"IEEE Catalog Number 89CH2742-5"
"SAN 264-620X"
Includes bibliographies and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA10142876#entity
https://lccn.loc.gov/89083677
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA10142876 : BA10142876
LC Control Number: 89083677
https://lccn.loc.gov/89083677