Proceedings : International Test Conference 2003

Author: [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

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Note (General)：: IEEE Catalog Number: 03CH37494Includes bibliographical references and index子書誌あり

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Material Type: 図書
ISBN: 0780381068
Title: Proceedings : International Test Conference 2003
Author/Editor: [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
Author Heading: International Test Conference
https://ci.nii.ac.jp/author/DA0261156X
IEEE Computer Society. Test Technology Technical Council
https://ci.nii.ac.jp/author/DA1250352X
Institute of Electrical and Electronics Engineers. Philadelphia Section
https://ci.nii.ac.jp/author/DA02648490
Publication, Distribution, etc.: International Test Conference
Publication Date: c2003
Publication Date (W3CDTF): 2003
Size: 28 cm
Alternative Title: International Test Conference 2003 : Proceedings : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): IEEE Catalog Number: 03CH37494
Includes bibliographical references and index
子書誌あり
Related Material: Board and system test track
https://cir.nii.ac.jp/crid/1130000795434131456
Related Material (URI): https://ci.nii.ac.jp/ncid/BA6540053X#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA6540053X : BA6540053X