SAE residual stress measurement by x-ray diffraction 2003 ed

SAE residual stress measurement by x-ray diffraction

2003 ed

Notes on use

Related materials as well as pre- and post-revision versions

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 9780768010695
Title: SAE residual stress measurement by x-ray diffraction
Edition: 2003 ed
Author Heading: SAE International
Publication, Distribution, etc.: SAE International
Publication Date: c2003
Publication Date (W3CDTF): 2003
Size: 28 cm
Alternative Title: Residual stress measurement by x-ray diffraction
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes bibliographical references
Related Material: SAE international
https://cir.nii.ac.jp/crid/1130000795373457408
Related Material (URI): https://ci.nii.ac.jp/ncid/BA67224518#entity
Periodical Title: SAE international
https://cir.nii.ac.jp/crid/1130000795373457408
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA67224518 : BA67224518