2000 GaAs Reliability Workshop Proceedings, November 5, 2000, Seattle, Washington :softbound

Author: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with Technical Co-Sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers

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Note (General)：: "IEEE catalog number 00TH8513"--T.P. versoIncludes bibliographical references

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Material Type: 図書
ISBN: 0790801027
Title: 2000 GaAs Reliability Workshop Proceedings, November 5, 2000, Seattle, Washington
Volume: :softbound
Author/Editor: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with Technical Co-Sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers
Author Heading: GaAs Reliability Workshop
JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
Publication, Distribution, etc.: IEEE Service Center
Publication Date: c2000
Publication Date (W3CDTF): 2000
Size: 28 cm
Alternative Title: 00TH8513
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Gallium arsenide semiconductors -- Reliability -- Congresses
Bipolar transistors -- Reliability -- Congresses
Accelerated life testing -- Congresses
Target Audience: 一般
Note (General): "IEEE catalog number 00TH8513"--T.P. verso
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA51066666#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA51066666 : BA51066666