Autotestcon 2004 proceedings : IEEE Systems Readiness Technology Conference : technology and tradition unite in San Antonio

Author: sponsors, IEEE Aerospace and Electronic Systems Society, IEEE Instrumentation and Measurement Society, IEEE Central Texas Council

Notes on use

Note (General)：: "IEEE catalog number: 04CH37560"--T.p."San Antonio, TX, 20-23 September 2004"--CoverIncludes bibliographical references and index

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Material Type: 図書
ISBN: 0780384490
Title: Autotestcon 2004 proceedings : IEEE Systems Readiness Technology Conference : technology and tradition unite in San Antonio
Author/Editor: sponsors, IEEE Aerospace and Electronic Systems Society, IEEE Instrumentation and Measurement Society, IEEE Central Texas Council
Author Heading: Autotestcon
https://ci.nii.ac.jp/author/DA03955611
IEEE Aerospace and Electronic Systems Society
https://ci.nii.ac.jp/author/DA02635965
IEEE Instrumentation and Measurement Society
https://ci.nii.ac.jp/author/DA03955666
IEEE Central Texas Council
Publication, Distribution, etc.: Institute of Electrical and Electronic Engineers
Publication Date: c2004
Publication Date (W3CDTF): 2004
Size: 28 cm
Alternative Title: 04CH37560
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog number: 04CH37560"--T.p.
"San Antonio, TX, 20-23 September 2004"--Cover
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA72215822#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA72215822 : BA72215822