Jump to main content
図書

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

Icons representing 図書

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

Material type
図書
Author
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
Publisher
IEEE Computer Society Press
Publication date
c1998
Material Format
Paper
Capacity, size, etc.
28 cm
NDC
-
View All

Notes on use

Note (General):

"IEEE Order Plan Catalog Number 98TB100236"--T.p. verso"IEEE Computer Society Order Number PR08494"--T.p. versoIncludes bibliographical references and...

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • CiNii Research

    Search Service
    Paper
    You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
0818684941
Author/Editor
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
Publication, Distribution, etc.
Publication Date
c1998
Publication Date (W3CDTF)
1998
Size
28 cm
Alternative Title
98TB100236
Memory Technology, Design and Testing
MTDT'98