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図書

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA :case.

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Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA :case.

Material type
図書
Author
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society
Publisher
Institute of Electrical and Electronics Engieers
Publication date
c2000
Material Format
Paper
Capacity, size, etc.
28 cm
NDC
-
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Notes on use

Note (General):

"IEEE Computer Society Order Number PR00689"--T.p. versoIncludes bibliographical references and index

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Paper

Material Type
図書
ISBN
0769506895
0769506909
Volume
:case.
Author/Editor
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society
Publication Date
c2000
Publication Date (W3CDTF)
2000
Size
28 cm