Annual Reliability and Maintainability Symposium, 2009 proceedings : the International Symposium on Product Quality and Integrity, Fort Worth, Texas, USA on January 26-29, 2009

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Material Type: 電子資料
ISBN: 9781424425099
Title: Annual Reliability and Maintainability Symposium, 2009 proceedings : the International Symposium on Product Quality and Integrity, Fort Worth, Texas, USA on January 26-29, 2009
Author Heading: Reliability and Maintainability Symposium
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c2009
Publication Date (W3CDTF): 2009
Size: 12 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog number: CFP09RAM-CDR"--T. p. verso
Related Material (URI): https://ci.nii.ac.jp/ncid/BA90952516#entity
https://lccn.loc.gov/78132873
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA90952516 : BA90952516
LC Control Number: 78132873
https://lccn.loc.gov/78132873