Test critiques v. 1 v. 2 v. 3 v. 4 v. 5 v. 6 v. 7 v. 8 v. 9 v.10

Test critiques v. 1

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Note (General)：: Includes bibliographies and indexesv. 8-10 publisher: Austin, Texas : PRO-ED

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Material Type: 図書
ISBN: 0961128666
0961128674
0961128682
0933701020
0933701047
0933701101
0933701209
0890792542
0890795215
0890795967
Title: Test critiques
Volume: v. 1
v. 2
v. 3
v. 4
v. 5
v. 6
v. 7
v. 8
v. 9
v.10
Author/Editor: Daniel J. Keyser, Richard C. Sweetland, general editors
Author Heading: Keyser, Daniel J.
https://ci.nii.ac.jp/author/DA02101326
Sweetland, Richard C.
https://ci.nii.ac.jp/author/DA02101315
Publication, Distribution, etc.: Test Corporation of America
Publication Date: c1984-
Publication Date (W3CDTF): 1984
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Psychological tests -- Evaluation
Educational tests and measurements -- Evaluation
Business -- Examinations -- Evaluation
LCC: BF176
Target Audience: 一般
Note (General): Includes bibliographies and indexes
v. 8-10 publisher: Austin, Texas : PRO-ED
Related Material (URI): https://ci.nii.ac.jp/ncid/BA0449542X#entity
https://lccn.loc.gov/84026895
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA0449542X : BA0449542X
LC Control Number: 84026895
https://lccn.loc.gov/84026895