Characteristics of rare-earth element erbium implanted in silicon

• Material Type: 記事
• Title: Characteristics of rare-earth element erbium implanted in silicon
• Author Heading: Y. S. Tang; K. C. Heasman; W. P. Gillin; B. J. Sealy
• Publication Date: 1989-07-31
• Publication Date (W3CDTF): 1989-07-31
• Periodical title: Applied Physics Letters
• No. or year of volume/issue: 55 5
• Volume: 55
• Issue: 5
• Pages: 432-433
• Publication date of volume/issue (W3CDTF): 1989-07-31
• ISSN (Periodical Title): 00036951
• Publication (Periodical Title): AIP Publishing
• Target Audience: 一般
• DOI: 10.1063/1.101888; https://doi.org/10.1063/1.101888
• Date Created (W3CDTF): 2002-07-26
• Related Material (URI): https://pubs.aip.org/aip/apl/article-pdf/55/5/432/18472259/432_1_online.pdf
• Is Referenced By: Relativistic Effect on Multiplet Terms of Rare Earth Ions.; https://cir.nii.ac.jp/crid/1390001204180919424; Photoluminescence of Erbium Implanted in SiGe.; https://cir.nii.ac.jp/crid/1390001206246286336; Ab Initio Calculations of the Multiplet Terms of (TmP4)3+ Cluster; https://cir.nii.ac.jp/crid/1390282679155543936
• Data Provider (Database): 国立情報学研究所 : CiNii Research; https://cir.nii.ac.jp/
• Original Data Provider (Database): Crossref; https://www.crossref.org

• Summary, etc.: <jats:p>Rare-earth element erbium implanted into silicon was studied by photoluminescence and Rutherford backscattering analysis. Two sets of luminesc...