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Backside localization of open and shorted IC interconnections SAND981652C DE98 003971 CONF980320

Backside localization of open and shorted IC interconnections SAND981652C DE98 003971 CONF980320
Microform規格・テクニカルリポート類
Cole, E. I, Tangyunyong, P, Barton, D. L1998<LS-DE98/003971>
National Diet Library

Failure analysis for micro-electrical-mechanical systems (MEMS) SAND971733C DE97 007265

Failure analysis for micro-electrical-mechanical systems (MEMS) SAND971733C DE97 007265
Microform規格・テクニカルリポート類
Peterson, K. A, Tangyunyong, P, Barton, D. L1997<LS-DE97/007265>
National Diet Library

Photon statistics, film preparation and characterization in fluorescent microthermal imaging SAND-95-1670C DE95 016098 CONF-9511562

Photon statistics, film preparation and characterization in fluorescent microthermal imaging SAND-95-1670C DE95 016098 CONF-9511562
Microform規格・テクニカルリポート類
Tangyunyong, P, Barton, D. L1995<LS-DE95/016098>
National Diet Library

Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes SAND-95-1351C DE96 006982 CONF-96016312

Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes SAND-95-1351C DE96 006982 CONF-96016312
Microform規格・テクニカルリポート類
Helms, C. J, Berg, N. H, Barton, D. L, Osinski, M1996<LS-DE96/006982>
National Diet Library

Fluorescent microthermal imaging-theory and methodology for achieving high thermal resolution images SAND-95-1945C DE95 017569 CONF-95081392

Fluorescent microthermal imaging-theory and methodology for achieving high thermal resolution images SAND-95-1945C DE95 017569 CONF-95081392
Microform規格・テクニカルリポート類
Barton, D. L, Tangyunyong, P1995<LS-DE95/017569>
National Diet Library

Infrared light emission from semiconductor devices SAND-96-2218C DE96 015012 CONF-9611804

Infrared light emission from semiconductor devices SAND-96-2218C DE96 015012 CONF-9611804
Microform規格・テクニカルリポート類
Barton, D. L, Tangyunyong, P, Soden, J. M, Liang, A. Y, Low, F. J1996<LS-DE96/015012>
National Diet Library

Degradation of blue AlGaN/InGaN/GaN LEDs subjected to high current pulses SAND-95-0504C DE95 008824 CONF-9504322

Degradation of blue AlGaN/InGaN/GaN LEDs subjected to high current pulses SAND-95-0504C DE95 008824 CONF-9504322
Microform規格・テクニカルリポート類
Barton, D. L, Zeller, J, Phillips, B. S, Chiu, P. C, Askar, S1994<LS-DE95/008824>
National Diet Library

INFRARED LIGHT EMISSION FROM SEMICONDUCTOR DEVICES (SAND ; SAND-96-2218C)

INFRARED LIGHT EMISSION FROM SEMICONDUCTOR DEVICES (SAND ; SAND-96-2218C)
Paper図書
BARTON,D.L. (SANDIA NATIONAL LABS., ALBUQUERGUE, NM (UNITED STATES).)Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingBARTON,D.L.

FLUORESCENT MICROTHERMAL IMAGING-THEORY AND METHODOLOGY FOR ACHIEVING HIGH THERMAL RESOLUTION IMAGES (SAND ; SAND-95-1945C)

FLUORESCENT MICROTHERMAL IMAGING-THEORY AND METHODOLOGY FOR ACHIEVING HIGH THERMAL RESOLUTION IMAGES (SAND ; SAND-95-1945C)
Paper図書
BARTON, D.L.// TANGYUNYONG, P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

LIFE TESTS OF NICHIA ALGAN/INGAN/GAN BLUE-LIGHT-EMITTING DIODES (SAND ; SAND-95-1351C)

LIFE TESTS OF NICHIA ALGAN/INGAN/GAN BLUE-LIGHT-EMITTING DIODES (SAND ; SAND-95-1351C)
Paper図書
HELMS, C.J.// BERG, N.H.// BARTON, D.L.// OSINSKI, M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan

PHOTON STATISTICS, FILM PREPARATION AND CHARACTERIZATION IN FLUORESCENT MICROTHERMAL IMAGING (SAND ; SAND-95-1670C)

PHOTON STATISTICS, FILM PREPARATION AND CHARACTERIZATION IN FLUORESCENT MICROTHERMAL IMAGING (SAND ; SAND-95-1670C)
Paper図書
TANGYUNYONG, PAIBOON// BARTON, D.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

FLUORESCENT MICROTHERMOGRAPHIC IMAGING. (SAND ; SAND-93-1874C)

FLUORESCENT MICROTHERMOGRAPHIC IMAGING. (SAND ; SAND-93-1874C)
Paper図書
BARTON, D.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan

ADVANCED FAILURE ANALYSIS LABORATORY EQUIPMENT NETWORKING. (SAND ; SAND-93-1748C)

ADVANCED FAILURE ANALYSIS LABORATORY EQUIPMENT NETWORKING. (SAND ; SAND-93-1748C)
Paper図書
HENDERSON, C.L.// BARTON, D.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan

USE OF THE CHARGE-INDUCED VOLTAGE ALTERATION TECHNIQUE TO ANALYZE PRECURSORS TO DIELECTRIC BREAKDOWN (SAND ; SAND-92-0462C)

USE OF THE CHARGE-INDUCED VOLTAGE ALTERATION TECHNIQUE TO ANALYZE PRECURSORS TO DIELECTRIC BREAKDOWN (SAND ; SAND-92-0462C)
Paper図書
BARTON, D.L.// COLE, E.I. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// RIFE, J.L.// BARTON, D.L.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan

CASE HISTORY: WAFER LEVEL FAILURE ANALYSIS OF FUNCTIONAL ICS WITH ELEVATED I/SUB DDQ/ CAUSED BY RESISTIVE GATE OXIDE SHORTS (SAND ; SAND-91-0789C)

CASE HISTORY: WAFER LEVEL FAILURE ANALYSIS OF FUNCTIONAL ICS WITH ELEVATED I/SUB DDQ/ CAUSED BY RESISTIVE GATE OXIDE SHORTS (SAND ; SAND-91-0789C)
Paper図書
BARTON, D.L.// HORRY, M.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan

DEGRADATION OF BLUE ALGAN/INGAN/GAN LEDS SUBJECTED TO HIGH CURRENT PULSES (SAND ; SAND-95-0504C)

DEGRADATION OF BLUE ALGAN/INGAN/GAN LEDS SUBJECTED TO HIGH CURRENT PULSES (SAND ; SAND-95-0504C)
Paper図書
BARTON, D.L.// ZELLER, J.// PHILLIPS, B.S.// CHIU, P.C.// ASKAR, S.// LEE, D.S.// OSINSKI, M.// MALLOY, K.J. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

ANALYSIS OF PARAMETRIC DRIFT OF A MESFET-BASED GAAS MMIC DUE TO 125.DEGREE.C STORAGE (SAND ; SAND-92-2073C)

ANALYSIS OF PARAMETRIC DRIFT OF A MESFET-BASED GAAS MMIC DUE TO 125.DEGREE.C STORAGE (SAND ; SAND-92-2073C)
Paper図書
DREIKE, P.L.// BARTON, D.L.// SANDOVAL, C.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan

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