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The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin 1999 ed (NIST special publication ; 260-131) (Standard reference materials)

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin 1999 ed (NIST special publication ; 260-131) (Standard reference materials)
Microform図書
1999<YCA-C 13.48/4:260-131>
National Diet Library
  • Author HeadingEhrstein, James R Croarkin, M. C. (Mary Carroll) , 1934- National Institute of Standar...

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin (NIST special publication ; 260-131) (Standard reference materials)

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin (NIST special publication ; 260-131) (Standard reference materials)
Microform図書
1997<YCA-C 13.10:260-131>
National Diet Library
  • Author HeadingEhrstein, James R Croarkin, M. C. (Mary Carroll) , 1934- National Institute of Standar...

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