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Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113

Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Galloway, K. F1997<LS-DE97/004377>
National Diet Library

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732
Microform規格・テクニカルリポート類
Witczak, S. C, Schrimpf, R. D, Galloway, K. F, Schmidt, D. M, Fleetwood, D. M1996<LS-DE96/006384>
National Diet Library

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)
Paper図書
WITCZAK, S.C.// SCHRIMPF, R.D.// GALLOWAY, K.F.// SCHMIDT, D.M.// FLEETWOOD, D.M.// PEASE, R.L.// COOMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingWITCZAK, S.C. SCHRIMPF, R.D. GALLOWAY, K.F. SCHMIDT, D.M. FLEETWOOD, D.M....

ESTIMATING LOW-DOSE RATE IRRADIATION RESPONSE OF MOSFETS (SAND ; SAND-94-0457C)

ESTIMATING LOW-DOSE RATE IRRADIATION RESPONSE OF MOSFETS (SAND ; SAND-94-0457C)
Paper図書
KHOSROPOUR, P.// GALLOWAY, K.F.// SCHRIMPF, R.D.// FLEETWOOD, D.M.// CALVEL, P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingKHOSROPOUR, P. GALLOWAY, K.F. SCHRIMPF, R.D. FLEETWOOD, D.M...

Some aspects of using a scanning electron microscope for total dose testing

Some aspects of using a scanning electron microscope for total dose testing
Paper図書
K.F. Galloway and P. RoitmanU.S. Dept. of Commerce, National Bureau of Standards1977
Other Libraries in Japan

SEMICONDUCTOR TECHNOLOGY PROGRAM - PROGRESS BRIEFS. (INTERIM REPT. 1 APR-30 JUN 81). (PB ; PB82-135898; NBSIR-81-2230-3)

SEMICONDUCTOR TECHNOLOGY PROGRAM - PROGRESS BRIEFS. (INTERIM REPT. 1 APR-30 JUN 81). (PB ; PB82-135898; NBSIR-81-2230-3)
Paper図書
GALLOWAY, K.F.
Other Libraries in Japan
  • Author HeadingGALLOWAY, K.F.

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