yr 〜
yr

Search results 13

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)
Paper図書
SPIEc2008.<M17-09-192>
National Diet LibraryOther Libraries in Japan
  • Author HeadingGu, Zu-Han. Hanssen, Leonard Matheus, 19...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)
Paper図書
SPIEc2007.<M17-07-2920>
National Diet LibraryOther Libraries in Japan
  • Author HeadingDuparré, Angela. Singh, Bhanwar. Gu, Zu-Han.

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)
Paper図書
SPIEc2003.<M17-04-934>
National Diet Library
  • Author HeadingGu, Zu-Han. Maradudin, A. A.

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)
Paper図書
SPIEc2002.<M17-03-635>
National Diet Library
  • Author HeadingBoeing Company. Gu, Zu-Han. Maradudin, A. A.

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)
Paper図書
SPIEc2001.<M17-03-4990>
National Diet Library
  • Author HeadingGu, Zu-Han. Maradudin, A. A.

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA
Paper図書
Angela Duparré, Bhanwar Singh, Zu-Han GU, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan
  • Author Heading...Singh, Bhanwar Gu, Zu-Han Society of Photo-optical Inst...

Surface scattering and diffraction III : 4-6 August 2003, San Diego, California, USA

Surface scattering and diffraction III : 4-6 August 2003, San Diego, California, USA
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editor ; sponsored by SPIE--the International Society for Optical EngineeringSPIEc2003
Other Libraries in Japan
  • Author HeadingGu, Zu-Han Maradudin, A. A.

Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA

Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]SPIEc2002
Other Libraries in Japan
  • Author HeadingSociety of Photo-optical Instrumentation Engineers Gu, Zu-Han Maradudin, A. A.

Surface scattering and diffraction for advanced metrology : 1 August 2001 San Diego, USA

Surface scattering and diffraction for advanced metrology : 1 August 2001 San Diego, USA
Paper図書
Zu-Han Gu, Alexei A. Maradudin chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2001
Other Libraries in Japan
  • Author HeadingSociety of Photo-optical Instrumentation Engineers Gu, Zu-Han Maradudin, A. A.

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2000
Other Libraries in Japan
  • Author HeadingGu, Zu-Han Maradudin, A. A. Society of P...

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado pbk.

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado pbk.
Paper図書
Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and pubslished by SPIE--The International Society for Optical EngineeringSPIE1999
Other Libraries in Japan
  • Author HeadingChen, Philip T. C. Gu, Zu-Han Maradudin, A. A. Society of P...

Scattering and surface roughness II : 21-23 July 1998, San Diego, California

Scattering and surface roughness II : 21-23 July 1998, San Diego, California
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1998
Other Libraries in Japan
  • Author HeadingGu, Zu-Han Maradudin, A. A. Society of P...

Scattering and surface roughness : 30-31 July 1997, San Diego, California

Scattering and surface roughness : 30-31 July 1997, San Diego, California
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1997
Other Libraries in Japan
  • Author HeadingGu, Zu-Han Maradudin, A. A. Society of P...

Reached to the end of result.