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Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.

Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.
Paper図書
IEEEc2003.<M17-04-2068>
National Diet Library
  • Author Heading...apore Chapter. Ho, Philip. International Symposium on th...

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003
Paper図書
edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeIEEE Operations Centerc2003
Other Libraries in Japan

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound
Paper図書
edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in co-operation with National University of Singapore Centre for IC Failure Analysis & Reliability, Institute of Microelectronics,SingaporeInstitute of Electrical and Electronics Engineersc1997
Other Libraries in Japan

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