yr 〜
yr

Search results 10

Proceedings : IOLTS 2008 : 14th IEEE International On-Line Testing Symposium : Rhodes, Greece, 6-9 July, 2008

Proceedings : IOLTS 2008 : 14th IEEE International On-Line Testing Symposium : Rhodes, Greece, 6-9 July, 2008
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council ; organized by University of Athens, University of Piraeus, TIMA LaboratoryIEEE Computer Societyc2008
Other Libraries in Japan

Proceedings : IOLTS 2006 : 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10-12, 2006

Proceedings : IOLTS 2006 : 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10-12, 2006
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc2006
Other Libraries in Japan

Proceedings : IOLTS 2007 : 13th IEEE International On-Line Testing Symposium : Heraklion, Crete, Greece, 8-11 July, 2007

Proceedings : IOLTS 2007 : 13th IEEE International On-Line Testing Symposium : Heraklion, Crete, Greece, 8-11 July, 2007
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council ; organized by University of Athens, University of Piraeus, TIMA LaboratoryIEEE Computer Societyc2007
Other Libraries in Japan

Proceedings, eighth IEEE International High-Level Design Validation and Test Workshop : 12-14 November, 2003, San Francisco, California

Proceedings, eighth IEEE International High-Level Design Validation and Test Workshop : 12-14 November, 2003, San Francisco, California
Paper図書
sponsored by IEEE Computer Society Technical Council on Test Technology , IEEE Computer Society Technical Committee on Design AutomationIEEE Computer Societyc2003
Other Libraries in Japan

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California
Paper図書
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]IEEE Computer Societyc2003
Other Libraries in Japan

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker
Paper図書
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
Other Libraries in Japan

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case
Paper図書
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits SocietyIEEE Computer Societyc2001
Other Libraries in Japan

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA :case.

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA :case.
Paper図書
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits SocietyInstitute of Electrical and Electronics Engieersc2000
Other Libraries in Japan

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA
Paper図書
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits SocietyInstitute of Electrical and Electronics Engieersc1999
Other Libraries in Japan

Records of the 2000 IEEE international workshop on memory technology, design and testing : Aug 2000, San Jose, CA.

Records of the 2000 IEEE international workshop on memory technology, design and testing : Aug 2000, San Jose, CA.
Paper図書
<M17-00-2029>
National Diet Library
  • Author Heading...ittee on VLSI. IEEE. Computer Society. Technical Council on Test Technology.

Reached to the end of result.