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Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors BNL-60273 DE94 013538 CONF-9410613

Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors BNL-60273 DE94 013538 CONF-9410613
Microform規格・テクニカルリポート類
Eremin, V, Ivanov, A, Verbitskaya, E, Li, Z, Kraner, H. W1994<LS-DE94/013538>
National Diet Library

Study of the long term stability of the effective concentration of ionized space charges (N(sub eff)) of neutron irradiated silicon detectors fabricated by various thermal oxidations BNL-60294 DE94 013734 CONF-9410614

Study of the long term stability of the effective concentration of ionized space charges (N(sub eff)) of neutron irradiated silicon detectors fabricated by various thermal oxidations BNL-60294 DE94 013734 CONF-9410614
Microform規格・テクニカルリポート類
Li, Z, Chen, W, Kraner, H. W, Eremin, V, Lindstroem, G1994<LS-DE94/013734>
National Diet Library

Influence of oxidation on radiation hardness of silicon detectors BNL-60905 DE95 002466 CONF-93071634

Influence of oxidation on radiation hardness of silicon detectors BNL-60905 DE95 002466 CONF-93071634
Microform規格・テクニカルリポート類
Kraner, H. W, Li, Z, Lazanu, S, Biggeri, U, Borchi, E1993<LS-DE95/002466>
National Diet Library

Nuclear radiation detector materials : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, E.E. Haller, H.W. Kraner, and W.A. Higinbotham. (Materials Research Society symposia proceedings ; v. 16)

Nuclear radiation detector materials : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, E.E. Haller, H.W. Kraner, and W.A. Higinbotham. (Materials Research Society symposia proceedings ; v. 16)
Paper図書
North-Hollandc1983.<M15-A2938>
National Diet Library
  • Author HeadingHaller, E. E. Kraner, H. W. Higinbotham, William A.

ELEVATED TEMPERATURE ANNEALING OF THE NEUTRON INDUCED LEAKAGE CURRENT AND CORRESPONDING DEFECT LEVELS IN LOW AND HIGH RESISTIVITY SILICON DETECTORS (BNL ; BNL-60273)

ELEVATED TEMPERATURE ANNEALING OF THE NEUTRON INDUCED LEAKAGE CURRENT AND CORRESPONDING DEFECT LEVELS IN LOW AND HIGH RESISTIVITY SILICON DETECTORS (BNL ; BNL-60273)
Paper図書
EREMIN, V.// IVANOV, A.// VERBITSKAYA, E.// LI, Z.// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1994.
Other Libraries in Japan

FAST NEUTRON RADIATION DAMAGE EFFECTS ON HIGH RESISTIVITY SILICON JUNCTION DETECTORS (BNL ; BNL-46198(REV.))

FAST NEUTRON RADIATION DAMAGE EFFECTS ON HIGH RESISTIVITY SILICON JUNCTION DETECTORS (BNL ; BNL-46198(REV.))
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1992.
Other Libraries in Japan

FABRICATION OF LARGE AREA SI CYLINDRICAL DRIFT DETECTORS (BNL ; BNL-49016(REV.))

FABRICATION OF LARGE AREA SI CYLINDRICAL DRIFT DETECTORS (BNL ; BNL-49016(REV.))
Paper図書
CHEN, WEI// KRANER, H.W.// LI, ZHENG// REHAK, P.// HESS, F. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1994.
Other Libraries in Japan

STUDY OF THE LONG TERM STABILITY OF THE EFFECTIVE CONCENTRATION OF IONIZED SPACE CHARGES (N/SUB EFF/) OF NEUTRON IRRADIATED SILICON DETECTORS FABRICATED BY VARIOUS THERMAL OXIDATIONS (BNL ; BNL-60294)

STUDY OF THE LONG TERM STABILITY OF THE EFFECTIVE CONCENTRATION OF IONIZED SPACE CHARGES (N/SUB EFF/) OF NEUTRON IRRADIATED SILICON DETECTORS FABRICATED BY VARIOUS THERMAL OXIDATIONS (BNL ; BNL-60294)
Paper図書
LI, Z.// CHEN, W.// KRANER, H.W.// EREMIN, V.// LINDSTROEM, G.// SPIRITI, E. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1994.
Other Libraries in Japan

FABRICATION OF LARGE AREA SI CYLINDRIC DRIFT DETECTORS (BNL ; BNL-49016)

FABRICATION OF LARGE AREA SI CYLINDRIC DRIFT DETECTORS (BNL ; BNL-49016)
Paper図書
CHEN, W.// KRANER, H.W.// LI, Z.// REHAK, P.// HESS, F. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
Other Libraries in Japan

INFLUENCE OF OXIDATION ON RADIATION HARDNESS OF SILICON DETECTORS (BNL ; BNL-60905)

INFLUENCE OF OXIDATION ON RADIATION HARDNESS OF SILICON DETECTORS (BNL ; BNL-60905)
Paper図書
KRANER, H.W.// LI, Z.// LAZANU, S.// BIGGERI, U.// BORCHI, E.// BRUZZI, M. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
Other Libraries in Japan

MEASUREMENTS OF POSSIBLE TYPE INVERSION IN SILICON JUNCTION DETECTORS BY FAST NEUTRON IRRADIATION (BNL ; BNL-46210)

MEASUREMENTS OF POSSIBLE TYPE INVERSION IN SILICON JUNCTION DETECTORS BY FAST NEUTRON IRRADIATION (BNL ; BNL-46210)
Paper図書
LI, Z.// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (USA))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan

CHANGES IN ELECTRICAL PROPERTIES OF HIGH RESISTIVITY SILICON CAUSED BY FAST NEUTRON DAMAGE (BNL ; BNL-46198)

CHANGES IN ELECTRICAL PROPERTIES OF HIGH RESISTIVITY SILICON CAUSED BY FAST NEUTRON DAMAGE (BNL ; BNL-46198)
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan

STUDIES OF THE DEPENDENCE ON OXIDATION THERMAL PROCESSES OF EFFECTS ON THE ELECTRICAL PROPERTIES OF SILICON DETECTORS BY FAST NEUTRON RADIATION (BNL ; BNL-46086)

STUDIES OF THE DEPENDENCE ON OXIDATION THERMAL PROCESSES OF EFFECTS ON THE ELECTRICAL PROPERTIES OF SILICON DETECTORS BY FAST NEUTRON RADIATION (BNL ; BNL-46086)
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan

USE OF THE SIGNAL CURRENT PULSE SHAPE TO STUDY THE INTERNAL ELECTRIC FIELD PROFILE AND TRAPPING EFFECTS IN NEUTRON DAMAGED SILICON DETECTORS (BNL ; BNL-47506)

USE OF THE SIGNAL CURRENT PULSE SHAPE TO STUDY THE INTERNAL ELECTRIC FIELD PROFILE AND TRAPPING EFFECTS IN NEUTRON DAMAGED SILICON DETECTORS (BNL ; BNL-47506)
Paper図書
KRANER, H.W.// LI, Z.// FRETWURST, E. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1992.
Other Libraries in Japan

APPLICATION OF THE RAPID THERMAL PROCESS: SINTERING THE SPUTTERED ALUMINUM/SILICON CONTACT IN SILICON DETECTOR FABRICATION (BNL ; BNL-46100)

APPLICATION OF THE RAPID THERMAL PROCESS: SINTERING THE SPUTTERED ALUMINUM/SILICON CONTACT IN SILICON DETECTOR FABRICATION (BNL ; BNL-46100)
Paper図書
CHEN, WEI// LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan

IONIZING RADIATION EFFECTS ON SILICON TEST STRUCTURES (BNL ; BNL-49823)

IONIZING RADIATION EFFECTS ON SILICON TEST STRUCTURES (BNL ; BNL-49823)
Paper図書
KRANER, H.W.// BEUTTENMULLER, R.// CHEN, W.// KIERSTEAD, J.A.// LI, Z.// ZHANG, Y.// DOU, L.// FRETWURST, E.// LINDSTROEM, G. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
Other Libraries in Japan

NEUTRON RADIATION DAMAGE STUDIES ON SILICON DETECTORS (BNL ; BNL-45381)

NEUTRON RADIATION DAMAGE STUDIES ON SILICON DETECTORS (BNL ; BNL-45381)
Paper図書
LI, ZHENG// CHEN, W.// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (USA))Brookhaven National Laboratory(Brookhaven National Laboratory)1990.
Other Libraries in Japan

STUDIES OF FREQUENCY DEPENDENT C-V CHARACTERISTICS OF NEUTRON IRRADIATED P/SUP +/-N SILICON DETECTORS (BNL ; BNL-44648)

STUDIES OF FREQUENCY DEPENDENT C-V CHARACTERISTICS OF NEUTRON IRRADIATED P/SUP +/-N SILICON DETECTORS (BNL ; BNL-44648)
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (USA))Brookhaven National Laboratory(Brookhaven National Laboratory)1990.
Other Libraries in Japan

STUDIES OF DEEP LEVELS IN HIGH RESISTIVITY SILICON DETECTORS IRRADIATED BY HIGH FLUENCE FAST NEUTRONS USING A THERMALLY STIMULATED CURRENT SPECTROMETER (BNL ; BNL-49017)

STUDIES OF DEEP LEVELS IN HIGH RESISTIVITY SILICON DETECTORS IRRADIATED BY HIGH FLUENCE FAST NEUTRONS USING A THERMALLY STIMULATED CURRENT SPECTROMETER (BNL ; BNL-49017)
Paper図書
LI, Z.// KRANER, H.W.// CHEN, W.// BEUTTENMULLER, R.// BIGGERI, U.// BRUZZI, M.// BORCHI, E.// BALDINI, A.// SPILLANTINI, P. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
Other Libraries in Japan

FAST NEUTRON DAMAGE IN SILICON DETECTORS. (BNL ; BNL-41690)

FAST NEUTRON DAMAGE IN SILICON DETECTORS. (BNL ; BNL-41690)
Paper図書
KRANER, H.W.(et al.)Brookhaven National Laboratory(Brookhaven National Laboratory)1988.
Other Libraries in Japan
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