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2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.

2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.
Paper図書
IEEEc2005.<M17-07-543>
National Diet Library
  • Author HeadingMenon, Sankaran M. IEEE International Workshop o...

2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.

2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.
Paper図書
IEEEc2004.<M17-05-2561>
National Diet Library
  • Author HeadingMenon, Sankaran M. IEEE International Workshop o...

[Technical report] DA95-09645

[Technical report] DA95-09645
Microform規格・テクニカルリポート類
Menon, Sankaran M1994<LS-DI95/09645>
National Diet Library

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