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Effects of emitter-tied field plates on lateral PNP ionizing radiation response SAND980625C DE98 005032 CONF980705

Effects of emitter-tied field plates on lateral PNP ionizing radiation response SAND980625C DE98 005032 CONF980705
Microform規格・テクニカルリポート類
Barnaby, H. J, Schrimpf, R. D, Cirba, C. R, Pease, R. L, Fleetwood, D. M1998<LS-DE98/005032>
National Diet Library

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Fleetwood, D. M, Schrimpf, R. D1998<LS-DE98/005033>
National Diet Library

Measurement bias dependence of enhanced bipolar gain degradation at low dose rates SAND980623C DE98 005027

Measurement bias dependence of enhanced bipolar gain degradation at low dose rates SAND980623C DE98 005027
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Schrimpf, R. D, Barnaby, H. J1998<LS-DE98/005027>
National Diet Library

Enhanced low-rate radiation-induced charge trapping at the emitter-base/oxide interface of bipolar devices SAND-96-2092C DE96 014087 CONF-9612311

Enhanced low-rate radiation-induced charge trapping at the emitter-base/oxide interface of bipolar devices SAND-96-2092C DE96 014087 CONF-9612311
Microform規格・テクニカルリポート類
Fleetwood, D. M, Schrimpf, R. D1996<LS-DE96/014087>
National Diet Library

Modeling low-dose-rate effects in irradiated bipolar-base oxides SAND980494C DE98 005031 CONF980705

Modeling low-dose-rate effects in irradiated bipolar-base oxides SAND980494C DE98 005031 CONF980705
Microform規格・テクニカルリポート類
Graves, R. J, Cirba, C. R, Schrimpf, R. D, Milanowski, R. J, Saigne, F1997<LS-DE98/005031>
National Diet Library

Radiation-induced gain degradation in lateral PNP BJTs with lightly and heavily doped emitters SAND-97-0425C DE97 003203 CONF-97071115

Radiation-induced gain degradation in lateral PNP BJTs with lightly and heavily doped emitters SAND-97-0425C DE97 003203 CONF-97071115
Microform規格・テクニカルリポート類
Wu, A, Schrimpf, R. D, Pease, R. L, Fleetwood, D. M, Kosier, S. L1997<LS-DE97/003203>
National Diet Library

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732
Microform規格・テクニカルリポート類
Witczak, S. C, Schrimpf, R. D, Galloway, K. F, Schmidt, D. M, Fleetwood, D. M1996<LS-DE96/006384>
National Diet Library

Mechanisms of ionizing-radiation-induced gain degradation in lateral PNP BJTs SAND-96-0564C DE96 006385 CONF-9607733

Mechanisms of ionizing-radiation-induced gain degradation in lateral PNP BJTs SAND-96-0564C DE96 006385 CONF-9607733
Microform規格・テクニカルリポート類
Schmidt, D. M, Wu, A, Schrimpf, R. D, Fleetwood, D. M, Pease, R. L1996<LS-DE96/006385>
National Diet Library

Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base Oxides (SAND ; SAND-98-0494J)

Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base Oxides (SAND ; SAND-98-0494J)
Paper図書
C.R. Cirba [et al.]1998
Other Libraries in Japan
  • Author Heading....J. Saigne, F. Schrimpf, R.D. Witczak, S.C.

MECHANISMS OF IONIZING-RADIATION-INDUCED GAIN DEGRADATION IN LATERAL PNP BJTS (SAND ; SAND-96-0564C)

MECHANISMS OF IONIZING-RADIATION-INDUCED GAIN DEGRADATION IN LATERAL PNP BJTS (SAND ; SAND-96-0564C)
Paper図書
SCHMIDT, D.M.// WU, A.// SCHRIMPF, R.D.// FLEETWOOD, D.M.// PEASE, R.L.// COMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingSCHMIDT, D.M. WU, A. SCHRIMPF, R.D. FLEETWOOD, D.M. PEASE, R.L. C...

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)
Paper図書
WITCZAK, S.C.// SCHRIMPF, R.D.// GALLOWAY, K.F.// SCHMIDT, D.M.// FLEETWOOD, D.M.// PEASE, R.L.// COOMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingWITCZAK, S.C. SCHRIMPF, R.D. GALLOWAY, K.F. SCHMIDT, D.M. ...

ESTIMATING LOW-DOSE RATE IRRADIATION RESPONSE OF MOSFETS (SAND ; SAND-94-0457C)

ESTIMATING LOW-DOSE RATE IRRADIATION RESPONSE OF MOSFETS (SAND ; SAND-94-0457C)
Paper図書
KHOSROPOUR, P.// GALLOWAY, K.F.// SCHRIMPF, R.D.// FLEETWOOD, D.M.// CALVEL, P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingKHOSROPOUR, P. GALLOWAY, K.F. SCHRIMPF, R.D. FLEETWOOD, D.M. CALVEL, P.

BOUNDING THE TOTAL-DOSE RESPONSE OF MODERN BIPOLAR TRANSISTORS (SAND ; SAND-94-0458C)

BOUNDING THE TOTAL-DOSE RESPONSE OF MODERN BIPOLAR TRANSISTORS (SAND ; SAND-94-0458C)
Paper図書
KOSIER, S.L.// WEI, A.// SCHRIMPF, R.D.// COMBS, W.E.// FLEETWOOD, D.M.// DELAUS, M.// PEASE, R.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingKOSIER, S.L. WEI, A. SCHRIMPF, R.D. COMBS, W.E. FLEETWOOD, D.M. D...

CORRELATION OF HOT-CARRIER STRESS AND IONIZATION INDUCED DEGRADATION IN BIPOLAR TRANSISTORS (SAND ; SAND-94-0459C)

CORRELATION OF HOT-CARRIER STRESS AND IONIZATION INDUCED DEGRADATION IN BIPOLAR TRANSISTORS (SAND ; SAND-94-0459C)
Paper図書
PEASE, R.L.// KOSIER, S.L.// SCHRIMPF, R.D.// COMBS, W.E.// DELAUS, M.// FLEETWOOD, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingPEASE, R.L. KOSIER, S.L. SCHRIMPF, R.D. COMBS, W.E. DELAUS, M. FLEETW...

CHARGE SEPARATION IN BIPOLAR TRANSISTORS (SAND ; SAND-93-0381C)

CHARGE SEPARATION IN BIPOLAR TRANSISTORS (SAND ; SAND-93-0381C)
Paper図書
NOWLIN, R.N.// KOSIER, S.L.// SCHRIMPF, R.D.// COMBS, W.E.// FLEETWOOD, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingNOWLIN, R.N. KOSIER, S.L. SCHRIMPF, R.D. COMBS, W.E. FLEETWOOD, D.M.

EFFECTS OF OXIDE CHARGE AND SURFACE RECOMBINATION VELOCITY ON THE EXCESS BASE CURRENT OF BJTS (SAND ; SAND-93-1870C)

EFFECTS OF OXIDE CHARGE AND SURFACE RECOMBINATION VELOCITY ON THE EXCESS BASE CURRENT OF BJTS (SAND ; SAND-93-1870C)
Paper図書
KOSIER, S.L.// SCHRIMPF, R.D.// WEI, A.// DELAUS, M.// FLEETWOOD, D.M.// COMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingKOSIER, S.L. SCHRIMPF, R.D. WEI, A. DELAUS, M. FLEETWOOD,...

HARDNESS ASSURANCE AND TESTING ISSUES FOR BIPOLAR/BICMOS DEVICES (SAND ; SAND-93-0380C)

HARDNESS ASSURANCE AND TESTING ISSUES FOR BIPOLAR/BICMOS DEVICES (SAND ; SAND-93-0380C)
Paper図書
NOWLIN, R.N.// SCHRIMPF, R.D.// FLEETWOOD, D.M.// PEASE, R.L.// COMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingNOWLIN, R.N. SCHRIMPF, R.D. FLEETWOOD, D.M. PEASE, R.L. C...

ENHANCED CHARGE TRAPPING IN BIPOLAR SPACER OXIDES DURING LOW-DOSE-RATE IRRADIATION (SAND ; SAND-94-0382C)

ENHANCED CHARGE TRAPPING IN BIPOLAR SPACER OXIDES DURING LOW-DOSE-RATE IRRADIATION (SAND ; SAND-94-0382C)
Paper図書
FLEETWOOD, D.M.// REBER, R.A. JR.// WINOKUR, P.S.// KOSIER, S.L.// SCHRIMPF, R.D.// NOWLIN, R.N.// PEASE, R.L.// DELAUS, M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author Heading.... KOSIER, S.L. SCHRIMPF, R.D. NOWLIN, R.N. PEASE, R.L. DELA...

RADIATION-INDUCED CHARGE TRAPPING IN BIPOLAR BASE OXIDES (SAND ; SAND-96-0406C)

RADIATION-INDUCED CHARGE TRAPPING IN BIPOLAR BASE OXIDES (SAND ; SAND-96-0406C)
Paper図書
FLEETWOOD, D.M.// RIEWE, L.C.// WITCZAK, SCHRIMPF, R.D. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingFLEETWOOD, D.M. RIEWE, L.C. WITCZAK, SCHRIMPF, R.D.

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