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Plasma process monitor/control system SAND-97-1378C DE97 006837 CONF-97051431

Plasma process monitor/control system SAND-97-1378C DE97 006837 CONF-97051431
Microform規格・テクニカルリポート類
Stevenson, J. O, Ward, P. P, Smith, M. L, Markle, R. J1997<LS-DE97/006837>
National Diet Library

Parametric study on the solderability of etched PWB copper SAND-96-2151C DE96 014501 CONF-96092123

Parametric study on the solderability of etched PWB copper SAND-96-2151C DE96 014501 CONF-96092123
Microform規格・テクニカルリポート類
Hosking, F. M, Stevenson, J. O, Hernandez, C. L1996<LS-DE96/014501>
National Diet Library

Capillary flow of solder on chemically roughened PWB surfaces SAND-96-0338C DE96 007420 CONF-96031161

Capillary flow of solder on chemically roughened PWB surfaces SAND-96-0338C DE96 007420 CONF-96031161
Microform規格・テクニカルリポート類
Hosking, F. M, Stevenson, J. O, Yost, F. G1996<LS-DE96/007420>
National Diet Library

Process uniformity for plasma etchback and desmear in printed wiring board manufacturing SAND-96-1954 DE97 001599

Process uniformity for plasma etchback and desmear in printed wiring board manufacturing SAND-96-1954 DE97 001599
Microform規格・テクニカルリポート類
Ward, P. P, Smith, M. L, Stevenson, J. O, Smedley, R1996<LS-DE97/001599>
National Diet Library

Processing of aluminum 7075-T73 components after prolonged storage SAND-96-1146C DE96 010560 CONF-96041255

Processing of aluminum 7075-T73 components after prolonged storage SAND-96-1146C DE96 010560 CONF-96041255
Microform規格・テクニカルリポート類
Guilinger, T. R, Stevenson, J. O, Yang, R. G, Buchheit, R. G, Schmale, D. T1996<LS-DE96/010560>
National Diet Library

Numerical methods for determining interstitial oxygen in silicon SAND-93-0349 DE95 007710

Numerical methods for determining interstitial oxygen in silicon SAND-93-0349 DE95 007710
Microform規格・テクニカルリポート類
Stevenson, J. O, Medernach, J. W1995<LS-DE95/007710>
National Diet Library

Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability SAND-95-1752C DE95 016403 CONF-95071602

Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability SAND-95-1752C DE95 016403 CONF-95071602
Microform規格・テクニカルリポート類
Stevenson, J. O, Hosking, F. M, Guilinger, T. R, Yost, F. G, Sorensen, N. R1995<LS-DE95/016403>
National Diet Library

NCMS PWB program report surface finishes team task WBS No. 3.1.1: Phase 1, Etching Studies: Chemical etching of copper for improved solderability SAND-95-1241 DE95 015056

NCMS PWB program report surface finishes team task WBS No. 3.1.1: Phase 1, Etching Studies: Chemical etching of copper for improved solderability SAND-95-1241 DE95 015056
Microform規格・テクニカルリポート類
Stevenson, J. O, Guilinger, T. R, Hosking, F. M, Yost, F. G, Sorensen, N. R1995<LS-DE95/015056>
National Diet Library

Solderability enhancement of copper through chemical etching SAND-95-0734C DE95 010514 CONF-95041421

Solderability enhancement of copper through chemical etching SAND-95-0734C DE95 010514 CONF-95041421
Microform規格・テクニカルリポート類
Stevenson, J. O, Guilinger, T. R, Hosking, F. M, Yost, F. G, Sorensen, N. R1995<LS-DE95/010514>
National Diet Library

ベッカム : すべての愛について語ろう

ベッカム : すべての愛について語ろう
Paper図書
ジョー・スティーヴンソン 編, 細谷和宏 訳竹書房2002.8<KD978-H83>
National Diet LibraryOther Libraries in Japan

Reciprocal space analysis of the microstructure of luminescent and nonluminescent porous silicon films SAND-94-1736C DE95 005420 CONF-94114442

Reciprocal space analysis of the microstructure of luminescent and nonluminescent porous silicon films SAND-94-1736C DE95 005420 CONF-94114442
Microform規格・テクニカルリポート類
Lee, S. R, Barbour, J. C, Medernach, J. W, Stevenson, J. O, Custer, J. S1994<LS-DE95/005420>
National Diet Library

CAPILLARY FLOW OF SOLDER ON CHEMICALLY ROUGHENED PWB SURFACES (SAND ; SAND-96-0338C)

CAPILLARY FLOW OF SOLDER ON CHEMICALLY ROUGHENED PWB SURFACES (SAND ; SAND-96-0338C)
Paper図書
HOSKING, F.M.// STEVENSON, J.O.// YOST, F.G. (SANDIA NATIONAL LABS., LIVERMORE, CA (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingHOSKING, F.M. STEVENSON, J.O. YOST, F.G.

NUMERICAL METHODS FOR DETERMINING INTERSTITIAL OXYGEN IN SILICON (SAND ; SAND-93-0349)

NUMERICAL METHODS FOR DETERMINING INTERSTITIAL OXYGEN IN SILICON (SAND ; SAND-93-0349)
Paper図書
STEVENSON, J.O.// MEDERNACH, J.W. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingSTEVENSON, J.O. MEDERNACH, J.W.

David Beckham : talking

David Beckham : talking
Paper図書
hrsg. von Jo Stevenson ; [Übers.: Anne Litvin]Schwarzkopf & Schwarzkopfc2004
Other Libraries in Japan

BECKHAM : すべての愛について語ろう

BECKHAM : すべての愛について語ろう
Paper図書
ジョー・スティーヴンソン編 ; 細谷和宏訳竹書房2002.8
Other Libraries in Japan

SOLDERABILITY ENHANCEMENT OF COPPER THROUGH CHEMICAL ETCHING (SAND ; SAND-95-0734C)

SOLDERABILITY ENHANCEMENT OF COPPER THROUGH CHEMICAL ETCHING (SAND ; SAND-95-0734C)
Paper図書
STEVENSON, J.O.// GUILINGER, T.R.// HOSKING, F.M.// YOST, F.G.// SORENSEN, N.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingSTEVENSON, J.O. GUILINGER, T.R. HOSKING, F.M....

NCMS PWB PROGRAM REPORT SURFACE FINISHES TEAM TASK WBS NO. 3.1.1: PHASE 1, ETCHING STUDIES: CHEMICAL ETCHING OF COPPER FOR IMPROVED SOLDERABILITY (SAND ; SAND-95-1241)

NCMS PWB PROGRAM REPORT SURFACE FINISHES TEAM TASK WBS NO. 3.1.1: PHASE 1, ETCHING STUDIES: CHEMICAL ETCHING OF COPPER FOR IMPROVED SOLDERABILITY (SAND ; SAND-95-1241)
Paper図書
STEVENSON, J.O.// GUILINGER, T.R.// HOSKING, F.M.// YOST, F.G.// SORENSEN, N.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingSTEVENSON, J.O. GUILINGER, T.R. HOSKING, F.M....

INSPECTION OF CHEMICALLY ROUGHENED COPPER SURFACES USING OPTICAL INTERFEROMETRY AND SCANNING ELECTRON MICROSCOPY: ESTABLISHING A CORRELATION BETWEEN SURFACE MORPHOLOGY AND SOLDERABILITY (SAND ; SAND-95-1752C)

INSPECTION OF CHEMICALLY ROUGHENED COPPER SURFACES USING OPTICAL INTERFEROMETRY AND SCANNING ELECTRON MICROSCOPY: ESTABLISHING A CORRELATION BETWEEN SURFACE MORPHOLOGY AND SOLDERABILITY (SAND ; SAND-95-1752C)
Paper図書
STEVENSON, J.O.// HOSKING, F.M.// GUILINGER, T.R.// YOST, F.G.// SORENSEN, N.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingSTEVENSON, J.O. HOSKING, F.M. GUILINGER, T.R....

RECIPROCAL SPACE ANALYSIS OF THE MICROSTRUCTURE OF LUMINESCENT AND NONLUMINESCENT POROUS SILICON FILMS (SAND ; SAND-94-1736C)

RECIPROCAL SPACE ANALYSIS OF THE MICROSTRUCTURE OF LUMINESCENT AND NONLUMINESCENT POROUS SILICON FILMS (SAND ; SAND-94-1736C)
Paper図書
LEE, S.R.// BARBOUR, J.C.// MEDERNACH, J.W.// STEVENSON, J.O.// CUSTER, J.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingLEE, S.R. BARBOUR, J.C. MEDERNACH, J.W. STEVENSON, J.O. CUSTER, J.S.

SELECTIVE ELECTROCHEMICAL WAFER THINNING FOR SILICON CHARACTERIZATION (SAND ; SAND-91-2764)

SELECTIVE ELECTROCHEMICAL WAFER THINNING FOR SILICON CHARACTERIZATION (SAND ; SAND-91-2764)
Paper図書
MEDERNACH, J.W.// STEIN, H.J.// STEVENSON, J.O. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingMEDERNACH, J.W. STEIN, H.J. STEVENSON, J.O.
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