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Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan : 28-30 May 2012 : international workshops "stress management for 3D ICs using through silicon vias--design for reliability" : 12th international workshop on stress-induced phenomena in microelectronics : May 2012, Kyoto, Japan. (AIP Conference Proceedings ; 1601)
Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan : 28-30 May 2012 : international workshops "stress management for 3D ICs using through silicon vias--design for reliability" : 12th international workshop on stress-induced phenomena in microelectronics : May 2012, Kyoto, Japan. (AIP Conference Proceedings ; 1601)
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American Institute of Physics
2014.
<M17-15-831>
National Diet Library
Author Heading
...awa, Shinichi.
Sukharev, Valeriy.
Smith, Larry. SEMATECH, New Y...
Stress induced phenomiena and reliability in 3D microelectronics, Kyoto, Japan, 28-30 May 2012
Stress induced phenomiena and reliability in 3D microelectronics, Kyoto, Japan, 28-30 May 2012
Paper
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Paul S. Ho ... [et al.], editors
Curran Associate
c2014
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