Search results for "WINOKUR,P.S." | NDL Search

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New trends in the commercial IC industry and the impact on defense electronics SAND980325C DE98 002724 CONF980328

Microform規格・テクニカルリポート類

Dellin, T. A, Jorgenson, J. L, Winokur, P. S, Romig, A. D1998<LS-DE98/002724>

National Diet Library

Importance of ion energy on SEU in CMOS SRAMs SAND980626C DE98 005028 CONF980705

Microform規格・テクニカルリポート類

Dodd, P. E, Shaneyfelt, M. R, Sexton, F. W, Hash, G. L, Winokur, P. S1998<LS-DE98/005028>

National Diet Library

Effects of irradiation and isochronal anneal temperature on hole and electron trapping in MOS devices SAND980381C DE98 004964 CONF980705

Microform規格・テクニカルリポート類

Fleetwood, D. M, Winokur, P. S, Shaneyfelt, M. R, Riewe, L. C, Flament, O1998<LS-DE98/004964>

National Diet Library

Impact of aging on radiation hardness SAND-97-1571C DE97 006945 CONF-97071116

Microform規格・テクニカルリポート類

Shaneyfelt, M. R, Winokur, P. S, Fleetwood, D. M1997<LS-DE97/006945>

National Diet Library

Effects of temperature on MOS radiation response SAND-97-0602C DE97 003729 CONF-9709341

Microform規格・テクニカルリポート類

Shaneyfelt, M. R, Schwank, J. R, Fleetwood, D. M, Winokur, P. S1997<LS-DE97/003729>

National Diet Library

Effects of reliability screens of MOS charge trapping SAND-95-0514C DE95 017838 CONF-95091071

Microform規格・テクニカルリポート類

Shanneyfelt, M. R, Winokur, P. S, Fleetwood, D. M, Schwank, J. R, Reber, R. A. Jr1995<LS-DE95/017838>

National Diet Library

Fast and slow border traps in MOS devices SAND-95-1935C DE95 017550 CONF-9512471

Microform規格・テクニカルリポート類

Fleetwood, D. M, Warren, W. L, Schwank, J. R, Winokur, P. S, Shaneyfelt, M. R1995<LS-DE95/017550>

National Diet Library

The Role of Electron Transport and Trapping in MOS Total-Dose Modeling (SAND ; SAND99-0355C)

Paper図書

O. Flament [et al.]Sandia National Lab.1999.2.10.

Other Libraries in Japan

FAST AND SLOW BORDER TRAPS IN MOS DEVICES (SAND ; SAND-95-1935C)

Paper図書

FLEETWOOD, D.M.// WARREN, W.L.// SCHWANK, J.R.// WINOKUR, P.S.// SHANEYFELT, M.R.// RIEWE, L.C. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.

Other Libraries in Japan

ROLE OF BURN-IN DURING QUALIFICATION TESTING (SAND ; SAND-94-0448C)

Paper図書

SHANEYFELT, M.R.// FLEETWOOD, D.M.// SCHWANK, J.R.// MEISENHEIMER, T.L.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.

Other Libraries in Japan

CRITICAL EXAMINATION OF CHARGE FUNNELING AND ITS IMPACT ON SINGLE-EVENT UPSET IN SI DEVICES (SAND ; SAND-94-0367C)

Paper図書

DODD, P.E.// SEXTON, F.W.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.

Other Libraries in Japan

EFFECTS OF RELIABILITY SCREENS OF MOS CHARGE TRAPPING (SAND ; SAND-95-0514C)

Paper図書

SHANNEYFELT, M.R.// WINOKUR, P.S.// FLEETWOOD, D.M.// SCHWANK, J.R.// REBER, R.A. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.

Other Libraries in Japan

EFFECTS OF DEVICE SCALING AND GEOMETRY ON MOS RADIATION HARDNESS ASSURANCE (SAND ; SAND-93-0531C)

Paper図書

SHANEYFELT, M.R.// FLEETWOOD, D.M.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.

Other Libraries in Japan

EFFECT OF SWITCHED-BIAS BAKES ON THE POSTIRRADIATION ELECTRICAL RESPONSE OF MOS DEVICES (SAND ; SAND-93-0346C)

Paper図書

FLEETWOOD, D.M.// SHANEYFELT, M.R.// RIEWE, L.C.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.

Other Libraries in Japan

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)

Paper図書

SHANEYFELT, M.R.// WINOKUR, P.S.// MEISENHEIMER, T.L.// SEXTON, F.W.// ROESKE, S.B.// KNOLL, M.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.

Other Libraries in Japan

DEFECT CENTERS IN CHEMICAL-MECHANICAL POLISHED MOS OXIDES (SAND ; SAND-94-2619C)

Paper図書

SHANEYFELT, M.R.// WARREN, W.L.// HETHERINGTON, D.L.// TIMON, R.P.// RESNICK, P.J.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.

Other Libraries in Japan

TEMPERATURE DEPENDENCE OF STATIC RAM VOLATILITY (SAND ; SAND-93-1926C)

Paper図書

MEISENHEIMER, T.L.// FLEETWOOD, D.M.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.

Other Libraries in Japan

SEU AND SEL RESPONSE OF THE WESTINGHOUSE 64K E/SUP 2/PROM, ANALOG DEVICES AD7876 12-BIT ADC, AND THE INTEL 82527 SERIAL COMMUNICATIONS CONTROLLER (SAND ; SAND-94-0449C)

Paper図書

SEXTON, F.W.// HASH, G.L.// CONNORS, M.P.// MURRAY, J.R.// SCHWANK, J.R.// WINOKUR, P.S.// BRADLEY, E.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.

Other Libraries in Japan

ADVANCED QUALIFICATION TECHNIQUES (SAND ; SAND-93-1323C)

Paper図書

WINOKUR, P.S.// SHANEYFELT, M.R.// MEISENHEIMER, T.L.// FLEETWOOD, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.

Other Libraries in Japan

ENHANCED CHARGE TRAPPING IN BIPOLAR SPACER OXIDES DURING LOW-DOSE-RATE IRRADIATION (SAND ; SAND-94-0382C)

Paper図書

FLEETWOOD, D.M.// REBER, R.A. JR.// WINOKUR, P.S.// KOSIER, S.L.// SCHRIMPF, R.D.// NOWLIN, R.N.// PEASE, R.L.// DELAUS, M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.

Other Libraries in Japan

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