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Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Fleetwood, D. M, Schrimpf, R. D1998<LS-DE98/005033>
National Diet Library

Measurement bias dependence of enhanced bipolar gain degradation at low dose rates SAND980623C DE98 005027

Measurement bias dependence of enhanced bipolar gain degradation at low dose rates SAND980623C DE98 005027
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Schrimpf, R. D, Barnaby, H. J1998<LS-DE98/005027>
National Diet Library

Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113

Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Galloway, K. F1997<LS-DE97/004377>
National Diet Library

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732
Microform規格・テクニカルリポート類
Witczak, S. C, Schrimpf, R. D, Galloway, K. F, Schmidt, D. M, Fleetwood, D. M1996<LS-DE96/006384>
National Diet Library

MODERATED DEGRADATION ENHANCEMENT OF LATERAL PNP TRANSISTORS DUE TO MEASUREMENT BIAS. (SMC ; SMC-TR-99-19; ADA363794)

MODERATED DEGRADATION ENHANCEMENT OF LATERAL PNP TRANSISTORS DUE TO MEASUREMENT BIAS. (SMC ; SMC-TR-99-19; ADA363794)
Paper図書
WITCZAK, S.C.(et al.)1999.
Other Libraries in Japan
  • Author HeadingWITCZAK, S.C.

SPACE CHARGE LIMITED DEGRADATION OF BIPOLAR OXIDES AT LOW ELECTRIC FIELDS. (SMC ; SMC-TR-99-17; ADA363802)

SPACE CHARGE LIMITED DEGRADATION OF BIPOLAR OXIDES AT LOW ELECTRIC FIELDS. (SMC ; SMC-TR-99-17; ADA363802)
Paper図書
WITCZAK, S.C.(et al.)1999.
Other Libraries in Japan
  • Author HeadingWITCZAK, S.C.

Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base Oxides (SAND ; SAND-98-0494J)

Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base Oxides (SAND ; SAND-98-0494J)
Paper図書
C.R. Cirba [et al.]1998
Other Libraries in Japan
  • Author Heading...Schrimpf, R.D. Witczak, S.C.

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)
Paper図書
WITCZAK, S.C.// SCHRIMPF, R.D.// GALLOWAY, K.F.// SCHMIDT, D.M.// FLEETWOOD, D.M.// PEASE, R.L.// COOMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingWITCZAK, S.C. SCHRIMPF, R.D. GALLOWAY, K.F....

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