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Collaboration and technology : 21st international conference, CRIWG 2015 : Yerevan, Armenia, September 22-25, 2015 : proceedings : Sep 2015, Yerevan, Armenia. (Lecture Notes in Computer Science ; 9334)

Collaboration and technology : 21st international conference, CRIWG 2015 : Yerevan, Armenia, September 22-25, 2015 : proceedings : Sep 2015, Yerevan, Armenia. (Lecture Notes in Computer Science ; 9334)
Paper図書
Springer[2015]<M17-16-761>
National Diet Library
  • Author Heading...loian, Nelson. Zorian, Yervant. Taslakian, Perouz. Shoukourya...

2010 5th international design and test workshop : (IDT 2010) : Abu Dhabi, United Arab Emirates : 14-15 December 2010 : Dec 2010, Abu Dhabi, United Arab Emirates.

2010 5th international design and test workshop : (IDT 2010) : Abu Dhabi, United Arab Emirates : 14-15 December 2010 : Dec 2010, Abu Dhabi, United Arab Emirates.
Paper図書
IEEEc2010.<M17-12-3252>
National Diet Library
  • Author Heading...Arab Emirates) Zorian, Yervant.

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2002.<M17-03-393>
National Diet Library
  • Author Heading.... Wik, Thomas. Zorian, Yervant. IEEE International Workshop o...

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2001.<M17-03-2017>
National Diet Library
  • Author HeadingZorian, Yervant. IEEE International Workshop o...

Proceedings, IDT 2007 : the 2007 2nd International Design and Test Workshop

Proceedings, IDT 2007 : the 2007 2nd International Design and Test Workshop
Paper図書
edited by Yervant Zorian ... [et al.]IEEEc2007
Other Libraries in Japan

Embedded processor-based self-test

Embedded processor-based self-test
Paper図書
by Dimitris Gizopoulos, Antonis Paschalis and Yervant ZorianKluwer Academicc2004
Other Libraries in Japan

Principles of testing electronic systems

Principles of testing electronic systems
Paper図書
Samiha Mourad, Yervant ZorianJohn Wiley & Sonsc2000
Other Libraries in Japan

Multi-chip module test strategies acid-free paper

Multi-chip module test strategies acid-free paper
Paper図書
edited by Yervant ZorianKluwerc1997
Other Libraries in Japan

On-line testing for VLSI alk. paper

On-line testing for VLSI alk. paper
Paper図書
edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. PradanKluwer Academic Publishersc1998
Other Libraries in Japan

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker
Paper図書
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
Other Libraries in Japan

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case
Paper図書
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits SocietyIEEE Computer Societyc2001
Other Libraries in Japan

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