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Proceedings : international test conference 2004. : Oct 2004, Charlotte, NC.

Proceedings : international test conference 2004. : Oct 2004, Charlotte, NC.
Paper図書
International Test Conferencec2004.<M17-05-425>
National Diet Library
  • Alternative TitleITC international test conference 2004 : proceedings : October ...
  • Alternative TitleITC international test conference 2004 : proceedings : October ...
  • Author HeadingInternational Test Conference (35th : 2004 : Charlotte, Nor...

Proceedings : international test conference 2003.

Proceedings : international test conference 2003.
Paper図書
International Test Conferencec2003.<M17-04-1530>
National Diet Library
  • Alternative TitleITC : international test conference 2003 : proceedings : Septembe...
  • Alternative TitleITC : international test conference 2003 : proceedings : Septembe...
  • Author HeadingInternational Test Conference (34th : 2003 : Charlotte, N.C...

Proceedings : international test conference 2002.

Proceedings : international test conference 2002.
Paper図書
International Test Conferencec2002.<M17-03-3670>
National Diet Library
  • Alternative TitleITC : international test conference 2002 : proceedings : October ...
  • Alternative TitleITC : international test conference 2002 : proceedings : October ...
  • Author HeadingInternational Test Conference (33rd : 2002 : Baltimore, Mar...

International test conference 2001 : proceedings : October 30-November 1, 2001 : Baltimore Convention Center : Baltimore, MD, USA. Oct 2001, Baltimore, MD.

International test conference 2001 : proceedings : October 30-November 1, 2001 : Baltimore Convention Center : Baltimore, MD, USA. Oct 2001, Baltimore, MD.
Microform図書
International Test Conferencec2001.<M17-LS-03-99>
National Diet Library
  • Author HeadingInternational Test Conference (32nd : 2001 : Baltimore, Mar...

Proceedings : International Test Conference 2004

Proceedings : International Test Conference 2004
Paper図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2004
Other Libraries in Japan
  • Note (General)"2004 International Test Conference, our 35th"--P. 1 IEEE Catalog...
  • Alternative TitleInternational Test Conference 2004 : proceedings : October ...
  • Alternative TitleInternational Test Conference 2004 : proceedings : October ...

Board and system test track

Board and system test track
Paper図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2003
Other Libraries in Japan
  • Related MaterialProceedings : International Test Conference 2003
  • Periodical TitleProceedings : International Test Conference 2003
  • Alternative Title...m test track : International Test Conference 2003 International Test Conference 2003 : Proceedings : Board an...

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
Paper図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2002
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test T...

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
Paper図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2001
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test T...

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche
Paper図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2000
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 2000 : proceedings
  • Alternative TitleITC : International Test Conference 2000 : proceedings
  • Author HeadingInternational Test Conference IEEE Computer Society IEEE Co...

Proceedings : International Test Conference 1999 : soft : case : microfiche

Proceedings : International Test Conference 1999 : soft : case : microfiche
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]International Test Conferencec1999
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 1999 ITC : International Test Conference 1999 : proceedings
  • Alternative TitleITC : International Test Conference 1999 ITC : International Test Conference 1999 : proceedings
  • Author HeadingInternational Test Conference IEEE Computer Society

Proceedings : International Test Conference 1998 : soft : case : microfiche

Proceedings : International Test Conference 1998 : soft : case : microfiche
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1998
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 1998 ITC : International Test Conference 1998 : proceedings
  • Alternative TitleITC : International Test Conference 1998 ITC : International Test Conference 1998 : proceedings
  • Author HeadingInternational Test Conference IEEE Computer Society

Proceedings : International Test Conference 1997 : soft : case :microfiche :CD-ROM

Proceedings : International Test Conference 1997 : soft : case :microfiche :CD-ROM
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1997
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 1997 1997 IEEE International Test Conference Test and design validity 97CH...
  • Alternative TitleITC : International Test Conference 1997 1997 IEEE International Test Conference Test and design validity 97CH...
  • Author HeadingInternational Test Conference IEEE Computer Society

Proceedings : International Test Conference 1996 : soft : case :microfiche :CD-ROM

Proceedings : International Test Conference 1996 : soft : case :microfiche :CD-ROM
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1996
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 1996 1996 IEEE International Test Conference Test and design validity 96CH...
  • Alternative TitleITC : International Test Conference 1996 1996 IEEE International Test Conference Test and design validity 96CH...
  • Author HeadingInternational Test Conference IEEE Computer Society

Proceedings : International Test Conference 1995 : soft : case : microfiche

Proceedings : International Test Conference 1995 : soft : case : microfiche
Paper図書
International Test Conferencec1995
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 1995 1995 IEEE International Test Conference 95CB35858 95CH35858
  • Alternative TitleITC : International Test Conference 1995 1995 IEEE International Test Conference 95CB35858 95CH35858
  • Author HeadingInternational Test Conference

Proceedings : International Test Conference 1994 : soft : case

Proceedings : International Test Conference 1994 : soft : case
Paper図書
International Test Conferencec1994
Other Libraries in Japan
  • Alternative TitleITC : International Test Conference 1994 1994 IEEE International Test Conference
  • Alternative TitleITC : International Test Conference 1994 1994 IEEE International Test Conference
  • Author HeadingInternational Test Conference

Proceedings : International Test Conference 1993 : soft : case

Proceedings : International Test Conference 1993 : soft : case
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1993
Other Libraries in Japan
  • Note (General)At head of title: ITC : International Test Conference 1993 "October 17-21, 1993, Co...
  • Alternative TitleITC : International Test Conference 1993 1993 IEEE International Test Conference Designing, testing, and diagn...
  • Alternative TitleITC : International Test Conference 1993 1993 IEEE International Test Conference Designing, testing, and diagn...

Proceedings : International Test Conference 1992 : soft. : case. : micro.

Proceedings : International Test Conference 1992 : soft. : case. : micro.
Paper図書
[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]International Test Conferencec1992
Other Libraries in Japan
  • Note (General)At head of title: ITC : International Test Conference 1992 "September 20-24, 1992, ...
  • Alternative TitleITC : International Test Conference 1992 1992 IEEE International Test Conference Discover the new world of tes...
  • Alternative TitleITC : International Test Conference 1992 1992 IEEE International Test Conference Discover the new world of tes...

Proceedings : International Test Conference 1991 : library binding : microfiche : casebound

Proceedings : International Test Conference 1991 : library binding : microfiche : casebound
Paper図書
International Test Conferencec1991
Other Libraries in Japan
  • Note (General)At head of title: ITC : International Test Conference 1991 "IEEE Catalog Number 91C...
  • Alternative TitleITC : International Test Conference 1991 1991 IEEE International Test Conference 91CH30320
  • Alternative TitleITC : International Test Conference 1991 1991 IEEE International Test Conference 91CH30320

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