Jump to main content

yr 〜
yr

Search results 3

Built-in Quiescent Supply Current Test Circuits for Electrical Interconnect Tests in 3D Stacked ICs

Built-in Quiescent Supply Current Test Circuits for Electrical Interconnect Tests in 3D Stacked ICs
Digital博士論文障害者向け資料あり
Binti Ali, Fara Ashikin2018-09-27
National Diet Library
  • Subject Heading3D Stacked IC Open defects Design-for-Testability Through-Silicon Via Electrica...

Studies on Power, Thermal & False-path Aware Test Techniques for Modern System-on-Chips

Studies on Power, Thermal & False-path Aware Test Techniques for Modern System-on-Chips
Digital博士論文
Yu, Thomas Edison ChuaNara Institute of Science and Technology2009-03-24
Other Libraries in Japan
  • Subject HeadingSoC low-power low-temperature multi-cycle design-for-testability

Studies on design for delay testability and over-testing reduction for delay faults

Studies on design for delay testability and over-testing reduction for delay faults
Digital博士論文
吉川, 祐樹Nara Institute of Science and Technology2007-03-23
Other Libraries in Japan
  • Subject HeadingLSI testing Delay fault Design-for-testability Over-testing False path

Reached to the end of result.

RSS